AFO Electron Microscopy Domain Ontology (WD/2025/12)
type: Ontology
imports: afo
imports: electron-microscopy
issued: 2025-12-16T12:00:00Z
license: Creative Commons Attribution 4.0 International Public License
modified: 2025-06-25T12:00:00Z
rights: Derivative works attribution
rights: Copyright © 2021 Allotrope Foundation
version info: WD/2025/12

field-emission transmission electron microscope
type: Class
subclass of: transmission electron microscope
alternative label: FEG-TEM
alternative label: FEGTEM
alternative label: TEM-FEG
alternative label: field emission transmission electron microscope
alternative label: field-emission TEM
alternative label: field-emission-gun transmission electron microscope
definition: A piece of apparatus which is used to produce an enlarged image of an electron transparent specimen using a finely focused (less than 10 nm diameter) electron beam (produced by thermionic emission heating) with an acceleration voltage of 50-150 kV under vacuum. The energies and intensities of the transmitted electrons are measured. [CHMO]

field-emission scanning electron microscope
type: Class
subclass of: scanning electron microscope
alternative label: FE-SEM
alternative label: FEG-SEM
alternative label: field emission SEM
alternative label: field emission scanning electron microscope
alternative label: field-emission SEM
definition: A piece of apparatus which is used to produce an enlarged image of a specimen by scanning a finely focused (less than 10 nm diameter) electron beam produced by thermionic emission heating (field emission) with an acceleration voltage of 50-150 kV across the specimen under vacuum and measuring interaction of the electrons with the specimen. [CHMO]

transmission electron microscope with an energy dispersive X-ray analyzer
type: Class
subclass of: transmission electron microscope
alternative label: TEM/EDX
alternative label: transmission electron microscope equipped with an energy dispersive X-ray analyzer
definition: A piece of apparatus which is used to produce an enlarged image of an electron- transparent specimen using a finely focused (less than 10 nm diameter) electron beam with an acceleration voltage of 50--150 kV under vacuum. X-rays emerging from the sample (as a result of electron bombardment) pass through a slit, then a grating disperses them by diffraction according to their wavelength. Finally, X-ray energy (which is characteristic of atomic number) is converted to voltage pulses or 'counts' by a detector. [CHMO]

environmental scanning electron microscope
type: Class
subclass of: scanning electron microscope
alternative label: E-SEM
alternative label: ESEM
alternative label: environmental SEM
definition: A piece of apparatus which is used to produce an enlarged image of a specimen by scanning a finely focused (less than 10 nm diameter) electron beam with an acceleration voltage of 50--150 kV across the specimen in a gaseous environment and measuring interaction of the electrons with the specimen. [CHMO]

high-resolution transmission electron microscope
type: Class
subclass of: transmission electron microscope
alternative label: HRTEM
alternative label: high resolution transmission electron microscope
alternative label: high-resolution (HR) TEM
definition: A piece of apparatus which is used to produce an enlarged image of an electron transparent specimen using several finely focused (less than 10 nm diameter) electron beams with an acceleration voltage of 50--150 kV under vacuum. The amplitude of the interference of the transmitted electron waves is then measured and the phase contrast is used to produce an image. [CHMO]

cold-field-emission scanning electron microscope
type: Class
subclass of: scanning electron microscope
alternative label: CFE-SEM
alternative label: cold field emission SEM
alternative label: cold field emission scanning electron microscope
definition: A piece of apparatus which is used to produce an enlarged image of a specimen by scanning a finely focused (<10 nm diameter) electron beam produced by applying a high voltage to a tungsten crystal (cold-field emission) with an acceleration voltage of 50--150 kV across the specimen under vacuum and measuring interaction of the electrons with the specimen. [CHMO]

transmission electron microscope
type: Class
subclass of: AFE_0000143
alternative label: TEM
alternative label: transmission EM
definition: A piece of apparatus which is used to produce an enlarged image of an electron transparent specimen using a finely focused (less than 10 nm diameter) electron beam with an acceleration voltage of 50--150 kV under vacuum. The energies and intensities of the transmitted electrons are measured. [CHMO]

scanning electron microscope
type: Class
subclass of: AFE_0000143
alternative label: SEM
definition: A piece of apparatus which is used to produce an enlarged image of a specimen by scanning a finely focused (less than 10 nm diameter) electron beam with an acceleration voltage of 50--150 kV across the specimen under vacuum and measuring the interaction of the electrons with the specimen. [CHMO]

transmission electron microscope grid
type: Class
subclass of: AFE_0000407
AFX_0002798: true
AFX_0002809: CHMO_0002610
alternative label: TEM micro-grid
alternative label: TEM microgrid
alternative label: transmission electron microscope microgrid
definition: A thin film of micrometre thickness which is used as a support for specimens during transmission electron microscopy. [CHMO]

scanning transmission electron microscope
type: Class
subclass of: transmission electron microscope
alternative label: STEM
definition: A transmission electron microscope where the electron beam is scanned across an electron-transparent specimen under vacuum and the intensities of the transmitted electrons are measured. [CHMO]

spectroscopic photoemission and low energy electron microscope
type: Class
subclass of: AFE_0000143
alternative label: SPELEEM
definition: A piece of apparatus which combines a low energy electron microscope (LEEM) and an energy filtered x-ray photoemission electron microscope (XPEEM). [CHMO]

bright-field scanning transmission electron microscopy
type: Class
subclass of: scanning transmission electron microscopy
subclass of: bright-field transmission electron microscopy
alternative label: BF-STEM
alternative label: bright field scanning transmission electron microscopy
definition: A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum. The beam of electrons passes directly through an aperture before reaching the specimen. The image results from a weakening of the direct beam by its interaction with the sample. [CHMO]

negative-stain electron microscopy
type: Class
subclass of: AFP_0002244
alternative label: negative stain EM
alternative label: negative stain electron microscopy
alternative label: negative-stain EM
definition: A type of microscopy where the specimen is stained with heavy metals salts (to improve contrast) before being bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. [CHMO]

high-angular annular dark-field scanning transmission electron microscopy
type: Class
subclass of: annular dark-field scanning transmission electron microscopy
alternative label: HAADF-STEM
alternative label: high angle annular dark field scanning transmission electron microscopy
alternative label: high angular annular dark-field scanning transmission electron microscopy
alternative label: high-angle annular dark-field scanning transmission electron microscopy
definition: A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum. The beam of electrons is scattered or diffracted at high angles before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. An annular aperture is used to select electrons that have passed through given symmetric zones within the objective lens of the microscope. [CHMO]

scanning electron acoustic microscopy
type: Class
subclass of: scanning electron microscopy
alternative label: SEAM
definition: A type of microscopy where a pulsed electron beam is scanned over the surface of the specimen in order to generate elastic waves which are reflected and detected. [CHMO]

scanning electron microscopy
type: Class
subclass of: AFP_0002244
alternative label: SEM
alternative label: scanning electronic microscopy
definition: A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across the specimen under vacuum and the interaction of the electrons with the specimen is determined. [CHMO]

cryogenic transmission electron microscopy
type: Class
subclass of: transmission electron microscopy
subclass of: cryogenic electron microscopy
alternative label: LT-TEM
alternative label: cryo TEM
alternative label: cryo-TEM
alternative label: cryo-transmission electron microscopy
alternative label: cryogenic TEM
alternative label: low-temperature transmission electron microscopy
definition: A type of microscopy where an electron-transparent specimen, which is cooled in liquid ethane to 180 deg. C, is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]

reflection electron microscopy
type: Class
subclass of: AFP_0002244
alternative label: REM
alternative label: reflection EM
definition: A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The electrons elastically scattered by the specimen are detected. [CHMO]

high-resolution electron microscopy
type: Class
subclass of: AFP_0002244
alternative label: HREM
alternative label: high resolution EM
alternative label: high resolution electron microscopy
alternative label: high-resolution EM
definition: A type of microscopy where the specimen bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The specimen is tilted such that a low-order zone axis is closely parallel to the incident beam, and columns of atoms are viewed end-on by the beam. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. HREM imaging is used to explore crystal structures and imperfections on the atomic scale. [CHMO]

aberration-corrected high-resolution transmission electron microscopy
type: Class
subclass of: high-resolution transmission electron microscopy
alternative label: aberration corrected high resolution transmission electron microscopy
alternative label: aberration-corrected HRTEM
definition: A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the phase contrast between transmitted electron waves is used to produce an image. The beam is focused using a set of magnetic lenses which removes spherical aberration (an effect where the electron beam is deflected too strongly, resulting in a blurred image). [CHMO]

photoemission electron microscopy
type: Class
subclass of: AFP_0002244
alternative label: PEEM
alternative label: PEM
alternative label: photo-electron microscopy
alternative label: photo-emission microscopy
alternative label: photoelectron microscopy
definition: A type of electron microscopy where the distribution of electrons emitted by a specimen sample following excitation by UV light, synchrotron radiation or X-ray sources is used to produce an image. [CHMO]

field-emission electron microscopy
type: Class
subclass of: AFP_0002244
alternative label: FEM
alternative label: field electron microscopy
alternative label: field emission electron microscopy
alternative label: field emission microscopy
alternative label: field-emission microscopy
definition: A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) electron beam produced by field emission with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. [CHMO]

energy-filtered transmission electron microscopy
type: Class
subclass of: transmission electron microscopy
alternative label: EF-TEM
alternative label: EF/TEM
alternative label: EFTEM
alternative label: ESI
alternative label: electron spectroscopic imaging
alternative label: energy filtered TEM
alternative label: energy filtered transmission electron microscopy
alternative label: energy-filtered TEM
definition: A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of transmitted electrons of particular kinetic energies are measured. [CHMO]

weak-beam dark-field electron microscopy
type: Class
subclass of: AFP_0002244
alternative label: WBDF electron microscopy
alternative label: weak beam dark field electron microscopy
alternative label: weak-beam dark-field (WBDF) electron microscopy
definition: A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. A diffracted beam harmonic (a 'weak beam') is used rather than the diffracted beam itself, allowing much higher resolution to be obtained. [CHMO]

dark-field scanning transmission electron microscopy
type: Class
subclass of: scanning transmission electron microscopy
subclass of: dark-field transmission electron microscopy
alternative label: DF-STEM
definition: A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum. The beam of electrons is scattered or diffracted before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. [CHMO]

X-ray photoemission electron microscopy
type: Class
subclass of: photoemission electron microscopy
alternative label: X-ray excited PEEM
alternative label: X-ray photoelectron microscopy
alternative label: XPEEM
definition: A type of electron microscopy where the distribution of electrons emitted by a specimen sample following excitation with an X-ray source is used to produce an image. [CHMO]

aberration-corrected transmission electron microscopy
type: Class
subclass of: transmission electron microscopy
alternative label: Cs-corrected TEM
alternative label: aberration-corrected TEM
alternative label: spherical-aberration-corrected TEM
alternative label: spherical-aberration-corrected transmission electron microscopy
definition: A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum and the intensities of the transmitted electrons are measured. The electron beam is focused using a set of magnetic lenses which removes spherical aberration (an effect where the electron beam is deflected too strongly, described by the spherical aberration coefficient 'Cs', which results in a blurred image). [CHMO]

field-emission scanning electron microscopy
type: Class
subclass of: scanning electron microscopy
alternative label: FE SEM
alternative label: FE-SEM
alternative label: FE/SEM
alternative label: FEG-SEM
alternative label: FEGSEM
alternative label: FESEM
alternative label: FSEM
alternative label: field emission gun scanning electron microscopy
alternative label: field emission scanning electron microscopy
alternative label: field-emission gun scanning electron microscopy
definition: A type of microscopy where a finely focused (<10 nm diameter) electron beam produced by thermionic emission heating (field emission) and with an acceleration voltage 50-150 kV is scanned across the specimen under vacuum and the interaction of the electrons with the specimen is determined. [CHMO]

spin-polarized low-energy electron microscopy
type: Class
subclass of: low-energy electron microscopy
alternative label: SPLEEM
alternative label: spin polarized LEEM
alternative label: spin-polarized LEEM
definition: A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) low energy (1-100 eV) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. A magnet is used to align all electron spins parallel to the sample surface. [CHMO]

low-energy electron microscopy
type: Class
subclass of: AFP_0002244
alternative label: LE EM
alternative label: LEEM
alternative label: low energy EM
alternative label: low energy electron microscopy
alternative label: low-energy EM
definition: A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) low energy (1-100 eV) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. [CHMO]

weak-beam dark-field transmission electron microscopy
type: Class
subclass of: weak-beam dark-field electron microscopy
subclass of: transmission electron microscopy
alternative label: WBDF TEM
alternative label: WBDF transmission electron microscopy
alternative label: weak beam dark field transmission electron microscopy
alternative label: weak-beam dark-field (WBDF) transmission electron microscopy
definition: A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. A diffracted beam harmonic (a 'weak beam') is used rather than the diffracted beam itself, allowing much higher resolution to be obtained. [CHMO]

high-resolution transmission electron microscopy
type: Class
subclass of: transmission electron microscopy
alternative label: HR TEM
alternative label: HR-TEM
alternative label: HR/TEM
alternative label: HRTEM
alternative label: high resolution (HR) TEM
alternative label: high resolution TEM
alternative label: high resolution transmission electron microscopy
alternative label: high-resolution TEM
alternative label: phase contrast TEM
alternative label: phase contrast transmission electron microscopy
alternative label: phase-contrast TEM
alternative label: phase-contrast transmission electron microscopy
definition: A type of microscopy where an electron-transparent specimen is bombarded with several finely focused (<10 nm diameter) electron beams with an acceleration voltage 50-150 kV under vacuum, and the phase contrast between the transmitted interfering electron waves is used to produce an image. [CHMO]

transmission electron microscopy
type: Class
subclass of: AFP_0002244
alternative label: TEM
definition: A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]

high-voltage transmission electron microscopy
type: Class
subclass of: transmission electron microscopy
alternative label: HV TEM
alternative label: HV-TEM
alternative label: HV/TEM
alternative label: HVTEM
alternative label: high voltage TEM
alternative label: high voltage transmission electron microscopy
alternative label: high-voltage TEM
definition: A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 700-3000 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]

freeze-fracture transmission electron microscopy
type: Class
subclass of: transmission electron microscopy
alternative label: FF-TEM
alternative label: FF/TEM
alternative label: FFTEM
alternative label: freeze fracture TEM
alternative label: freeze fracture transmission electron microscopy
alternative label: freeze-fracture TEM
definition: A type of microscopy where the electron-transparent specimen (normally a fresh tissue or cell suspension) is prepared by rapid freezing using liquid nitrogen, then fractured, and the cold fractured surface is coated with Pt or Au by evaporation. The specimen is then bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]

scanning transmission electron microscopy
type: Class
subclass of: transmission electron microscopy
alternative label: STEM
alternative label: scanning TEM
definition: A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum and the intensities of the transmitted electrons are measured. [CHMO]

cold-field-emission scanning electron microscopy
type: Class
subclass of: field-emission scanning electron microscopy
alternative label: CFE SEM
alternative label: CFE-SEM
alternative label: CFE/SEM
alternative label: CFEG-SEM
alternative label: CFEGSEM
alternative label: CFSEM
alternative label: cold field emission gun scanning electron microscopy
alternative label: cold field emission scanning electron microscopy
alternative label: cold-field-emission gun scanning electron microscopy
alternative label: cold-field-gun scanning electron microscopy
definition: A type of microscopy where a finely focused (<10 nm diameter) electron beam produced by applying a high voltage to a tungsten crystal (cold-field emission) and with an acceleration voltage 50-150 kV is scanned across the specimen under vacuum and the interaction of the electrons with the specimen is determined. [CHMO]

transmission electron microscopy selected area electron diffraction
type: Class
subclass of: transmission electron microscopy
alternative label: TEM SAD
alternative label: TEM SAED
alternative label: TEM-SAD
alternative label: TEM-SAED
definition: A method for determining structure by directing a beam of high energy (10-200 keV) electrons at the sample within a transmission electron microscope and recording the resulting diffraction pattern produced by any electrons transmitted through the sample. [CHMO]

environmental scanning electron microscopy
type: Class
subclass of: scanning electron microscopy
alternative label: E-SEM
alternative label: ESEM
alternative label: environmental SEM
definition: A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across the specimen in a gaseous environment and the interaction of the electrons with the specimen is determined. [CHMO]

high resolution scanning electron microscopy
type: Class
subclass of: scanning electron microscopy
alternative label: HR SEM
alternative label: HR-SEM
alternative label: HRSEM
alternative label: high resolution SEM
alternative label: high-resolution SEM
alternative label: high-resolution scanning electron microscopy
definition: A type of microscopy where a finely focused electron beam is scanned across the specimen under vacuum and the secondary and backscattered electrons produced are detected. [CHMO]

cryogenic scanning electron microscopy
type: Class
subclass of: scanning electron microscopy
subclass of: cryogenic electron microscopy
alternative label: LT-SEM
alternative label: cryo SEM
alternative label: cryo-SEM
alternative label: cryo-scanning electron microscopy
alternative label: cryogenic SEM
alternative label: low-temperature scanning electron microscopy
definition: A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron transparent specimen under vacuum and the intensities of the transmitted electrons are measured. A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across the specimen, which is cooled in liquid ethane to 180 deg. C, under vacuum and the interaction of the electrons with the specimen is determined. [CHMO]

scanning electron microscopy energy dispersive X-ray spectroscopy
type: Class
subclass of: scanning electron microscopy
alternative label: SEM EDX
alternative label: SEM-EDX
alternative label: SEM-EDXA
alternative label: SEM/EDX
alternative label: SEM/EDXA
alternative label: scanning electron microscopy-energy dispersive X-ray spectroscopy
alternative label: scanning electron microscopy/energy dispersive X-ray analysis
alternative label: scanning electron microscopy/energy dispersive X-ray spectroscopy
definition: A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across the specimen under vacuum. The interaction of electrons with the specimen produces X-rays (with energies characteristic of atomic number) which are detected as a function of wavelength. [CHMO]

negative-staining transmission electron microscopy
type: Class
subclass of: transmission electron microscopy
alternative label: negative staining TEM
alternative label: negative staining transmission electron microscopy
alternative label: negative-staining TEM
definition: A type of microscopy where an electron-transparent specimen, that has been stained with heavy metals salts (e.g. uranyl acetate), is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]

annular dark-field scanning transmission electron microscopy
type: Class
subclass of: dark-field scanning transmission electron microscopy
alternative label: ADF-STEM
definition: A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum. The beam of electrons is scattered or diffracted before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. An annular aperture is used to select electrons that have passed through given symmetric zones within the objective lens of the microscope. [CHMO]

cryogenic electron microscopy
type: Class
subclass of: AFP_0002244
alternative label: LT-EM
alternative label: cryo EM
alternative label: cryo-EM
alternative label: cryo-electron microscopy
alternative label: cryogenic EM
alternative label: cryogenic-electron microscopy
alternative label: low-temperature electron microscopy
definition: A type of microscopy where the specimen, which is cooled in liquid ethane to 180 deg. C, is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. [CHMO]

abberration-corrected high-angular annular dark-field scanning transmission electron microscopy
type: Class
subclass of: high-angular annular dark-field scanning transmission electron microscopy
subclass of: aberration-corrected transmission electron microscopy
alternative label: AC-HAADF-STEM
alternative label: abberration corrected high angular annular dark field scanning transmission electron microscopy
alternative label: abberration-corrected high-angle annular dark-field scanning transmission electron microscopy
definition: A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum. The beam of electrons is scattered or diffracted at high angles before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. An annular aperture is used to select electrons that have passed through given symmetric zones within the objective lens of the microscope. The electron beam is focused using a set of magnetic lenses which removes spherical aberration (an effect where the electron beam is deflected too strongly, resulting in a blurred image). [CHMO]

scanning Auger microscopy
type: Class
subclass of: scanning electron microscopy
alternative label: SAM
alternative label: scanning Auger electron microscopy
definition: A type of microscopy where a focused electron beam of small diameter is used to produce Auger electrons which are detected. [CHMO]

bright-field transmission electron microscopy
type: Class
subclass of: transmission electron microscopy
alternative label: BF-TEM
alternative label: bright field TEM
alternative label: bright field transmission electron microscopy
alternative label: bright-field TEM
definition: A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV. under vacuum. The beam of electrons passes directly through an aperture before reaching the specimen. The image results from a weakening of the direct beam by its interaction with the sample. [CHMO]

transmission electron microscopy energy-dispersive X-ray spectroscopy
type: Class
subclass of: transmission electron microscopy
alternative label: TEM-EDS
alternative label: TEM-EDX
alternative label: TEM/EDS
alternative label: TEM/EDX analysis
definition: A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of electrons with the specimen produces X-rays (with energies characteristic of atomic number) which are detected as a function of wavelength. [CHMO]

field-emission transmission electron microscopy
type: Class
subclass of: transmission electron microscopy
alternative label: FE TEM
alternative label: FE-TEM
alternative label: FE/TEM
alternative label: FEG-TEM
alternative label: FEGTEM
alternative label: FETEM
alternative label: FTEM
alternative label: field emission gun transmission electron microscopy
alternative label: field emission transmission electron microscopy
alternative label: field-emission-gun transmission electron microscopy
definition: A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam produced by thermionic emission heating (field emission) and with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]

dark-field transmission electron microscopy
type: Class
subclass of: transmission electron microscopy
alternative label: DF-TEM
definition: A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV. under vacuum. The beam of electrons is scattered or diffracted before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. [CHMO]

high-resolution electron micrograph
type: Class
subclass of: electron micrograph
alternative label: HREM image
alternative label: HREM images
alternative label: HREM micrograph
alternative label: high resolution electron micrograph
definition: An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam with an acceleration voltage under vacuum, and detecting the transmitted, secondary, backscattered and diffracted electrons, and characteristic X-rays emitted. The specimen is tilted such that a low-order zone axis is closely parallel to the incident beam, and columns of atoms are viewed end-on by the beam. [CHMO]

scanning transmission electron micrograph
type: Class
subclass of: transmission electron micrograph
alternative label: STEM image
alternative label: STEM images
alternative label: scanning transmission electron micrographs
alternative label: scanning transmission electron microscopy image
alternative label: scanning transmission electron microscopy images
definition: An image obtained by scanning the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. [CHMO]

scanning electron micrograph
type: Class
subclass of: electron micrograph
alternative label: SEM image
alternative label: SEM images
alternative label: SEM micrograph
alternative label: SEM micrographs
alternative label: scanning electron microphotograph
alternative label: scanning electron microscope (SEM) image
alternative label: scanning electron microscope (SEM) images
alternative label: scanning electron microscope (SEM) micrograph
alternative label: scanning electron microscope (SEM) micrographs
alternative label: scanning electron microscopy (SEM) image
definition: An image obtained by scanning a finely focused (<10 nm diameter) electron beam across the specimen under vacuum. [CHMO]

aberration-corrected transmission electron micrograph
type: Class
subclass of: transmission electron micrograph
alternative label: Cs-corrected TEM image
alternative label: Cs-corrected TEM images
alternative label: aberration-corrected STEM image
alternative label: aberration-corrected STEM images
alternative label: spherical-aberration-corrected STEM image
alternative label: spherical-aberration-corrected STEM images
alternative label: spherical-aberration-corrected transmission electron micrograph
definition: An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. The electron beam is focused using a set of magnetic lenses which removes spherical aberration (an effect where the electron beam is deflected too strongly, described by the spherical aberration coefficient 'Cs', which results in a blurred image). [CHMO]

weak-beam dark-field transmission electron micrograph
type: Class
subclass of: transmission electron micrograph
alternative label: WBDF TEM image
alternative label: WBDF TEM images
alternative label: WBDF transmission electron micrograph
alternative label: weak beam dark field electron micrograph
alternative label: weak-beam dark-field (WBDF) transmission electron micrograph
definition: An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. A diffracted beam harmonic (a 'weak beam') is used rather than the diffracted beam itself, allowing much higher resolution to be obtained. [CHMO]

dark-field transmission electron micrograph
type: Class
subclass of: transmission electron micrograph
alternative label: dark field transmission electron micrograph
alternative label: dark-field TEM image
alternative label: dark-field TEM images
definition: An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the scattered transmitted electrons. [CHMO]

bright-field transmission electron micrograph
type: Class
subclass of: transmission electron micrograph
alternative label: bright field transmission electron micrograph
alternative label: bright-field TEM image
alternative label: bright-field TEM images
definition: An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the directly transmitted electrons. [CHMO]

negative-stained transmission electron micrograph
type: Class
subclass of: transmission electron micrograph
alternative label: negative stained transmission electron micrograph
alternative label: negative-stain TEM image
alternative label: negative-stain TEM images
alternative label: negative-stain TEM micrograph
alternative label: negative-stain TEM micrographs
alternative label: negative-stained TEM image
alternative label: negatively stained TEM image
alternative label: negatively stained transmission electron micrograph
alternative label: negatively-stained TEM micrograph
alternative label: negatively-stained TEM micrographs
definition: An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. The specimen is stained with heavy metals salts (e.g. uranyl acetate) to improve contrast. [CHMO]

transmission electron micrograph
type: Class
subclass of: electron micrograph
alternative label: TEM image
alternative label: TEM images
alternative label: TEM micrograph
alternative label: transmission electron microphotograph
alternative label: transmission electron microscope (TEM) image
alternative label: transmission electron microscope image
alternative label: transmission electron microscope images
alternative label: transmission electron microscopic (TEM) images
alternative label: transmission electron microscopic (TEM) imagess
alternative label: transmission electron microscopy (TEM) image
definition: An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. [CHMO]

electron micrograph
type: Class
subclass of: AFR_0000038
alternative label: EM image
alternative label: EM micrograph
alternative label: electron microphotograph
alternative label: electron microscopy image
definition: An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam with an acceleration voltage under vacuum, and detecting the transmitted, secondary, backscattered and diffracted electrons, and characteristic X-rays emitted. [CHMO]

field-emission scanning electron micrograph
type: Class
subclass of: electron micrograph
alternative label: FE-SEM image
alternative label: FE-SEM images
alternative label: FE-SEM micrograph
alternative label: FESEM image
alternative label: FESEM images
alternative label: FESEM micrographs
alternative label: field emission scanning electron micrograph
alternative label: field-emission scanning electron microphotograph
alternative label: field-emission scanning electron microscopy (FE-SEM) image
alternative label: field-emission scanning electron microscopy (SEM) image
definition: An image obtained by scanning a finely focused (<10 nm diameter) electron beam, produced by thermionic emission heating (field emission), across the specimen under vacuum. [CHMO]

high-angular annular dark-field scanning transmission electron micrograph
type: Class
subclass of: scanning transmission electron micrograph
alternative label: HAADF-STEM image
alternative label: HAADF-STEM images
alternative label: high angle annular dark field scanning transmission electron micrograph
alternative label: high angular annular dark-field scanning transmission electron micrograph
alternative label: high-angle annular dark-field scanning transmission electron micrograph
definition: An image obtained by scanning the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. The beam of electrons is scattered or diffracted at high angles before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. An annular aperture is used to select electrons that have passed through given symmetric zones within the objective lens of the microscope. [CHMO]

high-resolution scanning electron micrograph
type: Class
subclass of: scanning electron micrograph
alternative label: high resolution scanning electron micrograph
alternative label: high-resolution SEM image
alternative label: high-resolution SEM images
alternative label: high-resolution SEM micrograph
alternative label: high-resolution SEM micrographs
definition: An image obtained by scanning a finely focused (<10 nm diameter) electron beam across the specimen under vacuum. The specimen is tilted such that a low-order zone axis is closely parallel to the incident beam, and columns of atoms are viewed end-on by the beam. [CHMO]

high-resolution transmission electron micrograph
type: Class
subclass of: transmission electron micrograph
alternative label: HRTEM image
alternative label: high resolution (HR) TEM images
alternative label: high-resolution TEM image
alternative label: high-resolution TEM images
alternative label: high-resolution transmission electron image
alternative label: high-resolution transmission electron microscopy (HRTEM) image
alternative label: phase contrast TEM image
alternative label: phase-contrast TEM image
alternative label: phase-contrast TEM images
alternative label: phase-contrast TEM micrograph
alternative label: phase-contrast transmission electron micrograph
alternative label: phase-contrast transmission electron microphotograph
alternative label: phase-contrast transmission electron microscopy (TEM) image
definition: An image obtained by bombarding the specimen with several finely focused (<10 nm diameter) electron beams under vacuum and using the phase contrast between transmitted interfering electron waves. [CHMO]

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