AFO Electron Microscopy Domain Ontology (WD/2025/12)
field emission transmission electron microscope
field-emission-gun transmission electron microscope
A piece of apparatus which is used to produce an enlarged image of an electron transparent specimen using a finely focused (less than 10 nm diameter) electron beam (produced by thermionic emission heating) with an acceleration voltage of 50-150 kV under vacuum. The energies and intensities of the transmitted electrons are measured. [CHMO]
field-emission transmission electron microscope
field emission scanning electron microscope
A piece of apparatus which is used to produce an enlarged image of a specimen by scanning a finely focused (less than 10 nm diameter) electron beam produced by thermionic emission heating (field emission) with an acceleration voltage of 50-150 kV across the specimen under vacuum and measuring interaction of the electrons with the specimen. [CHMO]
field-emission scanning electron microscope
transmission electron microscope equipped with an energy dispersive X-ray analyzer
A piece of apparatus which is used to produce an enlarged image of an electron- transparent specimen using a finely focused (less than 10 nm diameter) electron beam with an acceleration voltage of 50--150 kV under vacuum. X-rays emerging from the sample (as a result of electron bombardment) pass through a slit, then a grating disperses them by diffraction according to their wavelength. Finally, X-ray energy (which is characteristic of atomic number) is converted to voltage pulses or 'counts' by a detector. [CHMO]
transmission electron microscope with an energy dispersive X-ray analyzer
A piece of apparatus which is used to produce an enlarged image of a specimen by scanning a finely focused (less than 10 nm diameter) electron beam with an acceleration voltage of 50--150 kV across the specimen in a gaseous environment and measuring interaction of the electrons with the specimen. [CHMO]
environmental scanning electron microscope
high resolution transmission electron microscope
A piece of apparatus which is used to produce an enlarged image of an electron transparent specimen using several finely focused (less than 10 nm diameter) electron beams with an acceleration voltage of 50--150 kV under vacuum. The amplitude of the interference of the transmitted electron waves is then measured and the phase contrast is used to produce an image. [CHMO]
high-resolution transmission electron microscope
cold field emission scanning electron microscope
A piece of apparatus which is used to produce an enlarged image of a specimen by scanning a finely focused (<10 nm diameter) electron beam produced by applying a high voltage to a tungsten crystal (cold-field emission) with an acceleration voltage of 50--150 kV across the specimen under vacuum and measuring interaction of the electrons with the specimen. [CHMO]
cold-field-emission scanning electron microscope
A piece of apparatus which is used to produce an enlarged image of an electron transparent specimen using a finely focused (less than 10 nm diameter) electron beam with an acceleration voltage of 50--150 kV under vacuum. The energies and intensities of the transmitted electrons are measured. [CHMO]
A piece of apparatus which is used to produce an enlarged image of a specimen by scanning a finely focused (less than 10 nm diameter) electron beam with an acceleration voltage of 50--150 kV across the specimen under vacuum and measuring the interaction of the electrons with the specimen. [CHMO]
transmission electron microscope microgrid
A thin film of micrometre thickness which is used as a support for specimens during transmission electron microscopy. [CHMO]
A transmission electron microscope where the electron beam is scanned across an electron-transparent specimen under vacuum and the intensities of the transmitted electrons are measured. [CHMO]
scanning transmission electron microscope
A piece of apparatus which combines a low energy electron microscope (LEEM) and an energy filtered x-ray photoemission electron microscope (XPEEM). [CHMO]
spectroscopic photoemission and low energy electron microscope
bright field scanning transmission electron microscopy
A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum. The beam of electrons passes directly through an aperture before reaching the specimen. The image results from a weakening of the direct beam by its interaction with the sample. [CHMO]
bright-field scanning transmission electron microscopy
A type of microscopy where the specimen is stained with heavy metals salts (to improve contrast) before being bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. [CHMO]
high angle annular dark field scanning transmission electron microscopy
high angular annular dark-field scanning transmission electron microscopy
high-angle annular dark-field scanning transmission electron microscopy
A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum. The beam of electrons is scattered or diffracted at high angles before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. An annular aperture is used to select electrons that have passed through given symmetric zones within the objective lens of the microscope. [CHMO]
high-angular annular dark-field scanning transmission electron microscopy
A type of microscopy where a pulsed electron beam is scanned over the surface of the specimen in order to generate elastic waves which are reflected and detected. [CHMO]
A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across the specimen under vacuum and the interaction of the electrons with the specimen is determined. [CHMO]
low-temperature transmission electron microscopy
A type of microscopy where an electron-transparent specimen, which is cooled in liquid ethane to 180 deg. C, is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]
cryogenic transmission electron microscopy
A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The electrons elastically scattered by the specimen are detected. [CHMO]
A type of microscopy where the specimen bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The specimen is tilted such that a low-order zone axis is closely parallel to the incident beam, and columns of atoms are viewed end-on by the beam. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. HREM imaging is used to explore crystal structures and imperfections on the atomic scale. [CHMO]
aberration corrected high resolution transmission electron microscopy
A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the phase contrast between transmitted electron waves is used to produce an image. The beam is focused using a set of magnetic lenses which removes spherical aberration (an effect where the electron beam is deflected too strongly, resulting in a blurred image). [CHMO]
aberration-corrected high-resolution transmission electron microscopy
A type of electron microscopy where the distribution of electrons emitted by a specimen sample following excitation by UV light, synchrotron radiation or X-ray sources is used to produce an image. [CHMO]
A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) electron beam produced by field emission with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. [CHMO]
energy filtered transmission electron microscopy
A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of transmitted electrons of particular kinetic energies are measured. [CHMO]
energy-filtered transmission electron microscopy
weak beam dark field electron microscopy
weak-beam dark-field (WBDF) electron microscopy
A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. A diffracted beam harmonic (a 'weak beam') is used rather than the diffracted beam itself, allowing much higher resolution to be obtained. [CHMO]
weak-beam dark-field electron microscopy
A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum. The beam of electrons is scattered or diffracted before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. [CHMO]
dark-field scanning transmission electron microscopy
A type of electron microscopy where the distribution of electrons emitted by a specimen sample following excitation with an X-ray source is used to produce an image. [CHMO]
spherical-aberration-corrected transmission electron microscopy
A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum and the intensities of the transmitted electrons are measured. The electron beam is focused using a set of magnetic lenses which removes spherical aberration (an effect where the electron beam is deflected too strongly, described by the spherical aberration coefficient 'Cs', which results in a blurred image). [CHMO]
aberration-corrected transmission electron microscopy
field emission gun scanning electron microscopy
field emission scanning electron microscopy
field-emission gun scanning electron microscopy
A type of microscopy where a finely focused (<10 nm diameter) electron beam produced by thermionic emission heating (field emission) and with an acceleration voltage 50-150 kV is scanned across the specimen under vacuum and the interaction of the electrons with the specimen is determined. [CHMO]
field-emission scanning electron microscopy
A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) low energy (1-100 eV) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. A magnet is used to align all electron spins parallel to the sample surface. [CHMO]
spin-polarized low-energy electron microscopy
A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) low energy (1-100 eV) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. [CHMO]
weak beam dark field transmission electron microscopy
weak-beam dark-field (WBDF) transmission electron microscopy
A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. A diffracted beam harmonic (a 'weak beam') is used rather than the diffracted beam itself, allowing much higher resolution to be obtained. [CHMO]
weak-beam dark-field transmission electron microscopy
high resolution transmission electron microscopy
phase contrast transmission electron microscopy
phase-contrast transmission electron microscopy
A type of microscopy where an electron-transparent specimen is bombarded with several finely focused (<10 nm diameter) electron beams with an acceleration voltage 50-150 kV under vacuum, and the phase contrast between the transmitted interfering electron waves is used to produce an image. [CHMO]
high-resolution transmission electron microscopy
A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]
high voltage transmission electron microscopy
A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 700-3000 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]
high-voltage transmission electron microscopy
freeze fracture transmission electron microscopy
A type of microscopy where the electron-transparent specimen (normally a fresh tissue or cell suspension) is prepared by rapid freezing using liquid nitrogen, then fractured, and the cold fractured surface is coated with Pt or Au by evaporation. The specimen is then bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]
freeze-fracture transmission electron microscopy
A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum and the intensities of the transmitted electrons are measured. [CHMO]
scanning transmission electron microscopy
cold field emission gun scanning electron microscopy
cold field emission scanning electron microscopy
cold-field-emission gun scanning electron microscopy
cold-field-emission scanning electron microscopy
cold-field-gun scanning electron microscopy
A type of microscopy where a finely focused (<10 nm diameter) electron beam produced by applying a high voltage to a tungsten crystal (cold-field emission) and with an acceleration voltage 50-150 kV is scanned across the specimen under vacuum and the interaction of the electrons with the specimen is determined. [CHMO]
A method for determining structure by directing a beam of high energy (10-200 keV) electrons at the sample within a transmission electron microscope and recording the resulting diffraction pattern produced by any electrons transmitted through the sample. [CHMO]
transmission electron microscopy selected area electron diffraction
A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across the specimen in a gaseous environment and the interaction of the electrons with the specimen is determined. [CHMO]
environmental scanning electron microscopy
high-resolution scanning electron microscopy
A type of microscopy where a finely focused electron beam is scanned across the specimen under vacuum and the secondary and backscattered electrons produced are detected. [CHMO]
high resolution scanning electron microscopy
low-temperature scanning electron microscopy
A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron transparent specimen under vacuum and the intensities of the transmitted electrons are measured. A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across the specimen, which is cooled in liquid ethane to 180 deg. C, under vacuum and the interaction of the electrons with the specimen is determined. [CHMO]
scanning electron microscopy-energy dispersive X-ray spectroscopy
scanning electron microscopy/energy dispersive X-ray analysis
scanning electron microscopy/energy dispersive X-ray spectroscopy
A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across the specimen under vacuum. The interaction of electrons with the specimen produces X-rays (with energies characteristic of atomic number) which are detected as a function of wavelength. [CHMO]
scanning electron microscopy energy dispersive X-ray spectroscopy
negative staining transmission electron microscopy
A type of microscopy where an electron-transparent specimen, that has been stained with heavy metals salts (e.g. uranyl acetate), is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]
negative-staining transmission electron microscopy
A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum. The beam of electrons is scattered or diffracted before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. An annular aperture is used to select electrons that have passed through given symmetric zones within the objective lens of the microscope. [CHMO]
annular dark-field scanning transmission electron microscopy
A type of microscopy where the specimen, which is cooled in liquid ethane to 180 deg. C, is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. [CHMO]
abberration corrected high angular annular dark field scanning transmission electron microscopy
abberration-corrected high-angle annular dark-field scanning transmission electron microscopy
A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum. The beam of electrons is scattered or diffracted at high angles before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. An annular aperture is used to select electrons that have passed through given symmetric zones within the objective lens of the microscope. The electron beam is focused using a set of magnetic lenses which removes spherical aberration (an effect where the electron beam is deflected too strongly, resulting in a blurred image). [CHMO]
abberration-corrected high-angular annular dark-field scanning transmission electron microscopy
A type of microscopy where a focused electron beam of small diameter is used to produce Auger electrons which are detected. [CHMO]
bright field transmission electron microscopy
A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV. under vacuum. The beam of electrons passes directly through an aperture before reaching the specimen. The image results from a weakening of the direct beam by its interaction with the sample. [CHMO]
bright-field transmission electron microscopy
A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of electrons with the specimen produces X-rays (with energies characteristic of atomic number) which are detected as a function of wavelength. [CHMO]
transmission electron microscopy energy-dispersive X-ray spectroscopy
field emission gun transmission electron microscopy
field emission transmission electron microscopy
field-emission-gun transmission electron microscopy
A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam produced by thermionic emission heating (field emission) and with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]
field-emission transmission electron microscopy
A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV. under vacuum. The beam of electrons is scattered or diffracted before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. [CHMO]
dark-field transmission electron microscopy
An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam with an acceleration voltage under vacuum, and detecting the transmitted, secondary, backscattered and diffracted electrons, and characteristic X-rays emitted. The specimen is tilted such that a low-order zone axis is closely parallel to the incident beam, and columns of atoms are viewed end-on by the beam. [CHMO]
scanning transmission electron micrographs
scanning transmission electron microscopy image
scanning transmission electron microscopy images
An image obtained by scanning the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. [CHMO]
scanning transmission electron micrograph
scanning electron microscope (SEM) image
scanning electron microscope (SEM) images
scanning electron microscope (SEM) micrograph
scanning electron microscope (SEM) micrographs
scanning electron microscopy (SEM) image
An image obtained by scanning a finely focused (<10 nm diameter) electron beam across the specimen under vacuum. [CHMO]
spherical-aberration-corrected STEM image
spherical-aberration-corrected STEM images
spherical-aberration-corrected transmission electron micrograph
An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. The electron beam is focused using a set of magnetic lenses which removes spherical aberration (an effect where the electron beam is deflected too strongly, described by the spherical aberration coefficient 'Cs', which results in a blurred image). [CHMO]
aberration-corrected transmission electron micrograph
weak beam dark field electron micrograph
weak-beam dark-field (WBDF) transmission electron micrograph
An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. A diffracted beam harmonic (a 'weak beam') is used rather than the diffracted beam itself, allowing much higher resolution to be obtained. [CHMO]
weak-beam dark-field transmission electron micrograph
dark field transmission electron micrograph
An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the scattered transmitted electrons. [CHMO]
dark-field transmission electron micrograph
bright field transmission electron micrograph
An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the directly transmitted electrons. [CHMO]
bright-field transmission electron micrograph
negative stained transmission electron micrograph
negatively stained transmission electron micrograph
An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. The specimen is stained with heavy metals salts (e.g. uranyl acetate) to improve contrast. [CHMO]
negative-stained transmission electron micrograph
transmission electron microscope (TEM) image
transmission electron microscopic (TEM) images
transmission electron microscopic (TEM) imagess
transmission electron microscopy (TEM) image
An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. [CHMO]
An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam with an acceleration voltage under vacuum, and detecting the transmitted, secondary, backscattered and diffracted electrons, and characteristic X-rays emitted. [CHMO]
field emission scanning electron micrograph
field-emission scanning electron microphotograph
field-emission scanning electron microscopy (FE-SEM) image
field-emission scanning electron microscopy (SEM) image
An image obtained by scanning a finely focused (<10 nm diameter) electron beam, produced by thermionic emission heating (field emission), across the specimen under vacuum. [CHMO]
field-emission scanning electron micrograph
high angle annular dark field scanning transmission electron micrograph
high angular annular dark-field scanning transmission electron micrograph
high-angle annular dark-field scanning transmission electron micrograph
An image obtained by scanning the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. The beam of electrons is scattered or diffracted at high angles before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. An annular aperture is used to select electrons that have passed through given symmetric zones within the objective lens of the microscope. [CHMO]
high-angular annular dark-field scanning transmission electron micrograph
high resolution scanning electron micrograph
An image obtained by scanning a finely focused (<10 nm diameter) electron beam across the specimen under vacuum. The specimen is tilted such that a low-order zone axis is closely parallel to the incident beam, and columns of atoms are viewed end-on by the beam. [CHMO]
high-resolution scanning electron micrograph
high-resolution transmission electron image
high-resolution transmission electron microscopy (HRTEM) image
phase-contrast transmission electron micrograph
phase-contrast transmission electron microphotograph
phase-contrast transmission electron microscopy (TEM) image
An image obtained by bombarding the specimen with several finely focused (<10 nm diameter) electron beams under vacuum and using the phase contrast between transmitted interfering electron waves. [CHMO]
high-resolution transmission electron micrograph
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