@prefix dct: .
@prefix owl: .
@prefix rdf: .
@prefix xml: .
@prefix xsd: .
@prefix af-c: .
@prefix af-e: .
@prefix af-m: .
@prefix af-p: .
@prefix af-q: .
@prefix af-r: .
@prefix af-x: .
@prefix rdfs: .
@prefix skos: .
@prefix af-cur: .
@base .
rdf:type owl:Ontology ;
owl:versionIRI ;
owl:imports ;
dct:rights ;
dct:modified "2019-12-05T12:00:00Z"^^xsd:dateTime ;
dct:rights ;
owl:versionInfo "WD/2020/03" ;
dct:license ;
dct:issued "2019-12-030T12:00:00Z"^^xsd:dateTime ;
dct:title "AFO Microscopy Domain Ontology (WD/2020/03)" ;
owl:priorVersion .
#################################################################
#
# Annotation properties
#
#################################################################
### http://purl.allotrope.org/ontologies/property#AFX_0002796
af-x:AFX_0002796 rdf:type owl:AnnotationProperty .
### http://purl.allotrope.org/ontologies/property#AFX_0002798
af-x:AFX_0002798 rdf:type owl:AnnotationProperty .
### http://purl.allotrope.org/ontologies/property#AFX_0002809
af-x:AFX_0002809 rdf:type owl:AnnotationProperty .
### http://purl.org/dc/terms/source
dct:source rdf:type owl:AnnotationProperty .
### http://www.w3.org/2004/02/skos/core#altLabel
skos:altLabel rdf:type owl:AnnotationProperty .
### http://www.w3.org/2004/02/skos/core#changeNote
skos:changeNote rdf:type owl:AnnotationProperty .
### http://www.w3.org/2004/02/skos/core#definition
skos:definition rdf:type owl:AnnotationProperty .
### http://www.w3.org/2004/02/skos/core#example
skos:example rdf:type owl:AnnotationProperty .
### http://www.w3.org/2004/02/skos/core#note
skos:note rdf:type owl:AnnotationProperty .
### http://www.w3.org/2004/02/skos/core#prefLabel
skos:prefLabel rdf:type owl:AnnotationProperty .
### http://www.w3.org/2004/02/skos/core#scopeNote
skos:scopeNote rdf:type owl:AnnotationProperty .
#################################################################
#
# Classes
#
#################################################################
### http://purl.allotrope.org/ontologies/equipment#AFE_0000001
af-e:AFE_0000001 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000129 ;
skos:definition "An optical microscope that works by scanning one or more focussed beams of light across the specimen. [CHMO]" ;
skos:prefLabel "confocal microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000002
af-e:AFE_0000002 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000559 ;
skos:altLabel "epifluorescent microscope" ;
skos:definition "A fluorescence microscope where the light source is mounted above (epi) the specimen and the excitation light passes through the microscope objective lens on its way toward the specimen. [CHMO]" ;
skos:prefLabel "epifluorescence microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000064
af-e:AFE_0000064 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000129 ;
skos:altLabel "dark field microscope" ,
"dark field optical microscope" ,
"dark-field optical microscope" ;
skos:definition "A piece of apparatus, consisting of an eyepiece, an objective lens, a condenser lens, stage, and light source, which collects electromagnetic radiation in the visible range. An opaque disc is placed underneath the condenser lens, so that only light that is scattered by objects on the slide can reach the eye. [CHMO]" ;
skos:prefLabel "dark-field microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000086
af-e:AFE_0000086 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000667 ;
skos:altLabel "FEG-TEM" ,
"FEGTEM" ,
"TEM-FEG" ,
"field emission transmission electron microscope" ,
"field-emission TEM" ,
"field-emission-gun transmission electron microscope" ;
skos:definition "A piece of apparatus which is used to produce an enlarged image of an electron transparent specimen using a finely focused (less than 10 nm diameter) electron beam (produced by thermionic emission heating) with an acceleration voltage of 50-150 kV under vacuum. The energies and intensities of the transmitted electrons are measured. [CHMO]" ;
skos:prefLabel "field-emission transmission electron microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000129
af-e:AFE_0000129 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000825 ,
af-e:AFE_0001745 ;
skos:altLabel "light microscope" ;
skos:definition "A piece of apparatus, consisting of an eyepiece, an objective lens, object turret, stage, and light source, which collects electromagnetic radiation in the visible range. [CHMO]" ;
skos:prefLabel "optical microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000143
af-e:AFE_0000143 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000825 ;
skos:definition "A piece of apparatus which is used to produce an enlarged image of a specimen using a finely focused (less than 10 nm diameter) electron beam with an acceleration voltage of 50--150 kV under vacuum and measuring the interaction of the electrons with the specimen. [CHMO]" ;
skos:prefLabel "electron microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000146
af-e:AFE_0000146 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000767 ;
skos:altLabel "FE-SEM" ,
"FEG-SEM" ,
"field emission SEM" ,
"field emission scanning electron microscope" ,
"field-emission SEM" ;
skos:definition "A piece of apparatus which is used to produce an enlarged image of a specimen by scanning a finely focused (less than 10 nm diameter) electron beam produced by thermionic emission heating (field emission) with an acceleration voltage of 50-150 kV across the specimen under vacuum and measuring interaction of the electrons with the specimen. [CHMO]" ;
skos:prefLabel "field-emission scanning electron microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000186
af-e:AFE_0000186 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000667 ;
skos:altLabel "TEM/EDX" ,
"transmission electron microscope equipped with an energy dispersive X-ray analyzer" ,
"transmission electron microscope with an energy dispersive X-ray analyser" ;
skos:changeNote "2016-02-03 Switched labels [OSTHUS]" ;
skos:definition "A piece of apparatus which is used to produce an enlarged image of an electron- transparent specimen using a finely focused (less than 10 nm diameter) electron beam with an acceleration voltage of 50--150 kV under vacuum. X-rays emerging from the sample (as a result of electron bombardment) pass through a slit, then a grating disperses them by diffraction according to their wavelength. Finally, X-ray energy (which is characteristic of atomic number) is converted to voltage pulses or 'counts' by a detector. [CHMO]" ;
skos:prefLabel "transmission electron microscope with an energy dispersive X-ray analyzer" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000192
af-e:AFE_0000192 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000129 ;
skos:altLabel "bright-field optical microscope" ,
"transmitted light microscope" ,
"transmitted-light microscope" ;
skos:definition "A piece of apparatus, consisting of an eyepiece, an objective lens, a condenser lens, stage, and light source, which collects electromagnetic radiation in the visible range. The specimen is illuminated with visible light transmitted from a source on the opposite side of the specimen from the objective. [CHMO]" ;
skos:prefLabel "bright-field microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000193
af-e:AFE_0000193 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000404 ;
skos:altLabel "Raman confocal microscope" ,
"confocal Raman microspectrometer" ;
skos:definition "A piece of apparatus, consisting of a laser beam (less than 10 \\mum diameter), a monochromator and a detector coupled to an optical microscope, which is used to measure Raman spectra. An aperture is used to discriminate between Raman signal coming from the laser spot and that coming from the out-of-focus region of the sample. [CHMO]" ;
skos:prefLabel "confocal Raman microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000241
af-e:AFE_0000241 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000395 ;
skos:altLabel "polarised transmitted light microscope"@en-gb ,
"polarized transmitted light microscope" ,
"transmitted light polarising microscope"@en-gb ,
"transmitted light polarizing microscope" ,
"transmitting polarising light microscope"@en-gb ,
"transmitting polarizing light microscope" ;
skos:changeNote "2016-02-03 Changed to altLabel [OSTHUS]" ;
skos:definition "A piece of apparatus, consisting of an eyepiece, an objective lens, object turret, stage, orthogonal polarizing filters and light source, which collects electromagnetic radiation in the visible range. The specimen is illuminated with visible light transmitted from a source on the opposite side of the specimen from the objective. [CHMO]" ;
skos:prefLabel "transmitting polarising microscope"@en-gb ,
"transmitting polarizing microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000296
af-e:AFE_0000296 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000001 ;
skos:altLabel "TSM" ,
"tandem scanning microscope" ;
skos:definition "An optical microscope that works by using a spinning Nipkow disc, a wheel pierced by a spiral of pinholes, to illuminate small areas of the sample. [CHMO]" ;
skos:prefLabel "tandem-scanning microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000328
af-e:AFE_0000328 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000825 ;
skos:altLabel "SPM" ;
skos:definition "A microscope which uses a probe to scan the surface of the specimen, mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position, producing an image of the surface. A feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. [CHMO]" ;
skos:prefLabel "scanning probe microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000349
af-e:AFE_0000349 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000001 ;
skos:altLabel "LSCM" ,
"laser scanner" ;
skos:changeNote "2015-11-11 add alt label [OSTHUS]" ;
skos:definition "An optical microscope that works by scanning a laser across the specimen. [CHMO]" ;
skos:prefLabel "laser-scanning confocal microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000395
af-e:AFE_0000395 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000129 ;
skos:altLabel "polarised light microscope"@en-gb ,
"polarised-light microscope"@en-gb ,
"polarising light microscope"@en-gb ,
"polarized light microscope" ,
"polarized-light microscope" ,
"polarizing light microscope" ;
skos:changeNote "2016-02-03 Changed label [OSTHUS]" ;
skos:definition "A piece of apparatus, consisting of an eyepiece, an objective lens, object turret, stage, orthogonal polarizing filters and light source, which collects electromagnetic radiation in the visible range. [CHMO]" ;
skos:prefLabel "polarising microscope"@en-gb ,
"polarizing microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000404
af-e:AFE_0000404 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000551 ,
af-e:AFE_0000825 ;
skos:altLabel "Raman microspectrometer" ;
skos:definition "A piece of apparatus, consisting of a Raman spectrometer coupled to an optical microscope, which is used to measure Raman spectra. [CHMO]" ;
skos:prefLabel "Raman microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000449
af-e:AFE_0000449 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000767 ;
skos:altLabel "E-SEM" ,
"ESEM" ,
"environmental SEM" ;
skos:definition "A piece of apparatus which is used to produce an enlarged image of a specimen by scanning a finely focused (less than 10 nm diameter) electron beam with an acceleration voltage of 50--150 kV across the specimen in a gaseous environment and measuring interaction of the electrons with the specimen. [CHMO]" ;
skos:prefLabel "environmental scanning electron microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000492
af-e:AFE_0000492 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000825 ,
af-e:AFE_0001745 ;
skos:altLabel "IR microscope" ;
skos:definition "A piece of apparatus, consisting of an optical microscope coupled to a reflecting magnifying mirror system, which is used to collect spatially resolved infrared spectra of the surface of a specimen. [CHMO]" ;
skos:prefLabel "infrared microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000515
af-e:AFE_0000515 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000667 ;
skos:altLabel "HRTEM" ,
"high resolution transmission electron microscope" ,
"high-resolution (HR) TEM" ;
skos:definition "A piece of apparatus which is used to produce an enlarged image of an electron transparent specimen using several finely focused (less than 10 nm diameter) electron beams with an acceleration voltage of 50--150 kV under vacuum. The amplitude of the interference of the transmitted electron waves is then measured and the phase contrast is used to produce an image. [CHMO]" ;
skos:prefLabel "high-resolution transmission electron microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000559
af-e:AFE_0000559 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000129 ;
skos:definition "A microscope that uses an excitation source to produce light which is passed through an excitation filter, reflects off the surface of a dichroic mirror onto the specimen which fluoresces, producing light that passes through an emission filter to select only the required wavelengths onto the collector lens. [CHMO]" ;
skos:prefLabel "fluorescence microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000595
af-e:AFE_0000595 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000328 ;
skos:altLabel "AFM" ;
skos:definition "A microscope which uses a sharp spike (known as a 'tip') mounted on the end of a cantilever to scan the surface of the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the force experienced by the tip as a function of position. A feedback loop is used to maintain a fixed relationship between the tip and surface during scanning. [CHMO]" ;
skos:prefLabel "atomic force microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000643
af-e:AFE_0000643 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000129 ;
skos:altLabel "inverted optical microscope" ;
skos:definition "A piece of apparatus, consisting of an eyepiece, an objective lens, object turret, stage, condenser and light source, which collects electromagnetic radiation in the visible range. In an inverted microscope the light source and condenser are mounted above the stage, while the objective lens and turret are mounted below the stage. [CHMO]" ;
skos:prefLabel "inverted microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000660
af-e:AFE_0000660 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000767 ;
skos:altLabel "CFE-SEM" ,
"cold field emission SEM" ,
"cold field emission scanning electron microscope" ;
skos:definition "A piece of apparatus which is used to produce an enlarged image of a specimen by scanning a finely focused (<10 nm diameter) electron beam produced by applying a high voltage to a tungsten crystal (cold-field emission) with an acceleration voltage of 50--150 kV across the specimen under vacuum and measuring interaction of the electrons with the specimen. [CHMO]" ;
skos:prefLabel "cold-field-emission scanning electron microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000667
af-e:AFE_0000667 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000143 ;
skos:altLabel "TEM" ,
"transmission EM" ;
skos:definition "A piece of apparatus which is used to produce an enlarged image of an electron transparent specimen using a finely focused (less than 10 nm diameter) electron beam with an acceleration voltage of 50--150 kV under vacuum. The energies and intensities of the transmitted electrons are measured. [CHMO]" ;
skos:prefLabel "transmission electron microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000767
af-e:AFE_0000767 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000143 ;
skos:altLabel "SEM" ;
skos:definition "A piece of apparatus which is used to produce an enlarged image of a specimen by scanning a finely focused (less than 10 nm diameter) electron beam with an acceleration voltage of 50--150 kV across the specimen under vacuum and measuring the interaction of the electrons with the specimen. [CHMO]" ;
skos:prefLabel "scanning electron microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000797
af-e:AFE_0000797 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000407 ;
af-x:AFX_0002798 "true"^^xsd:boolean ;
af-x:AFX_0002809 ;
skos:altLabel "TEM micro-grid" ,
"TEM microgrid" ,
"transmission electron microscope microgrid" ;
skos:definition "A thin film of micrometre thickness which is used as a support for specimens during transmission electron microscopy. [CHMO]" ;
skos:prefLabel "transmission electron microscope grid" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000845
af-e:AFE_0000845 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000667 ;
skos:altLabel "STEM" ;
skos:definition "A transmission electron microscope where the electron beam is scanned across an electron-transparent specimen under vacuum and the intensities of the transmitted electrons are measured. [CHMO]" ;
skos:prefLabel "scanning transmission electron microscope" .
### http://purl.allotrope.org/ontologies/equipment#AFE_0000848
af-e:AFE_0000848 rdf:type owl:Class ;
rdfs:subClassOf af-e:AFE_0000143 ;
skos:altLabel "SPELEEM" ;
skos:definition "A piece of apparatus which combines a low energy electron microscope (LEEM) and an energy filtered x-ray photoemission electron microscope (XPEEM). [CHMO]" ;
skos:prefLabel "spectroscopic photoemission and low energy electron microscope" .
### http://purl.allotrope.org/ontologies/process#AFP_0000004
af-p:AFP_0000004 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002405 ;
skos:altLabel "NSThM" ,
"SNThM" ,
"near-field scanning thermal microscopy" ;
skos:definition "A type of microscopy where a thermocouple probe is positioned very close to the surface of the specimen (in the near-field). An image of the surface is obtained by mechanically moving the thermocouple probe in a raster scan of the specimen, line by line, and recording the surface-probe heat transfer as a function of position. A feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. [CHMO]" ;
skos:prefLabel "scanning near-field thermal microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000030
af-p:AFP_0000030 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000468 ;
skos:altLabel "UV fluorescence microscopy" ,
"UVF microscopy" ,
"UVFM" ,
"ultra-violet fluorescence microscopy" ,
"ultraviolet fluorescence microscopy" ;
skos:definition "A type of microscopy where the specimen can be made to fluoresce (emit energy as visible light) by illuminating it with radiation in the ultra-violet region (4-380 nm). [CHMO]" ;
skos:prefLabel "ultraviolet fluorescence microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000084
af-p:AFP_0000084 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000468 ;
skos:altLabel "FLIM" ,
"fluorescence-lifetime imaging microscopy" ;
skos:definition "A type of microscopy where the specimen can be made to fluoresce (emit energy as visible light) by illuminating it with light of specific wavelengths and the spatial distribution of mean fluorescence lifetimes (usually on the ns scale) is mapped within the microscopic images. [CHMO]" ;
skos:prefLabel "fluorescence lifetime imaging microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000093
af-p:AFP_0000093 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000782 ;
skos:altLabel "PTMS" ,
"photothermal IR micro-spectroscopy" ,
"photothermal IR microscopy" ,
"photothermal IR microspectroscopy" ,
"photothermal infrared microspectroscopy" ;
skos:definition "The measurement of the photothermal response (temperature fluctuations) of a specimen exposed to the beam of a Fourier transform infrared spectrometer, using an atomic force microscope tip as the thermal probe. [CHMO]" ;
skos:prefLabel "photothermal infrared microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000121
af-p:AFP_0000121 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000782 ;
skos:altLabel " confocal infra-red chemical imaging spectroscopy" ,
"confocal IR spectromicroscopy" ,
"confocal IR-MSP" ,
"confocal infra-red chemical imaging spectrometry" ,
"confocal infra-red microscopy" ,
"confocal infrared chemical imaging spectrometry" ,
"confocal infrared chemical imaging spectroscopy" ,
"confocal infrared mapping" ,
"confocal infrared microspectrophotometry" ,
"confocal infrared microspectroscopy" ,
"confocal infrared spectromicroscopy" ;
skos:definition "The collection of spatially resolved infrared spectra of a sample during optical microscopy. An aperture is used to discriminate between infrared signal coming from the laser spot and that coming from the out-of-focus region of the sample. [CHMO]" ;
skos:prefLabel "confocal infrared microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000122
af-p:AFP_0000122 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001404 ;
skos:altLabel "PLM" ,
"POM" ,
"optical polarisation microscopy"@en-gb ,
"optical polarising microscopy"@en-gb ,
"optical polarization microscopy" ,
"polarised light microscopy"@en-gb ,
"polarised optical microscopy"@en-gb ,
"polarized light microscopy" ,
"polarized light optical microscopy" ,
"polarized optical microscopy" ,
"polarizing optical microscopy" ;
skos:definition "A type of microscopy where the specimen placed between two orthogonal polarizing filters and illuminated with visible light. [CHMO]" ;
skos:prefLabel "polarising light microscopy"@en-gb ,
"polarizing light microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000124
af-p:AFP_0000124 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001801 ;
skos:altLabel "EPR imaging" ,
"EPRI" ,
"ESR imaging" ,
"ESRI" ,
"electron paramagnetic imaging" .
### http://purl.allotrope.org/ontologies/process#AFP_0000130
af-p:AFP_0000130 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000476 ;
skos:altLabel "back-scattering SNIM" ,
"back-scattering SNOM" ,
"back-scattering near-field optical microscopy" ,
"back-scattering s-SNOM" ,
"back-scattering-based SNIM" ,
"back-scattering-type near-field optical microscopy" ,
"backscattering SNIM" ,
"backscattering SNOM" ,
"backscattering near-field optical microscopy" ,
"backscattering s-SNOM" ,
"backscattering-based SNIM" ,
"backscattering-type near-field optical microscopy" ,
"infrared scattering SNOM" ;
skos:definition "A type of microscopy where a laser is focused to a diffraction-limited spot size onto an oscillating AFM tip close to the surface of the specimen. An image is produced by scanning the probe over the specimen and detecting the backscattered light from the tip as a function of position. A force feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. [CHMO]" ;
skos:prefLabel "backscattering near-field optical microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000180
af-p:AFP_0000180 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001680 ;
skos:altLabel "KFM" ,
"KPFM" ,
"Kelvin force microscopy" ,
"Kelvin probe microscopy" ,
"SSPM" ,
"scanning surface potential microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000194
af-p:AFP_0000194 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001338 ;
skos:altLabel "super resolution bright field microscopy" ,
"super resolution bright field optical microscopy" ,
"super-resolution bright-field optical microscopy" ;
skos:definition "A type of microscopy where the specimen is illuminated with light transmitted from a source on the opposite side of the specimen from the objective, and image resolution (which is normally limited by diffraction) is enhanced by processing the images with image restoration algorithms. [CHMO]" ;
skos:prefLabel "super-resolution bright-field microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000196
af-p:AFP_0000196 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001864 ;
skos:altLabel "AP FIM" ,
"AP field ionisation microscopy"@en-gb ,
"AP field ionization microscopy" ,
"AP field-ion microscopy" ,
"AP field-ionisation microscopy"@en-gb ,
"AP field-ionization microscopy" ,
"AP-FIM" ,
"AP/FIM" ,
"APFIM" ,
"atom probe field ionisation microscopy"@en-gb ,
"atom probe field ionization microscopy" ,
"atom probe field-ion microscopy" ,
"atom probe field-ionisation microscopy"@en-gb ,
"atom probe field-ionization microscopy" ,
"atom-probe field-ion microscopy" ;
skos:definition "A type of microscopy where atoms in the vicinty of the specimen (which is in the form of a very sharp tip <10 m diameter) are ionized by the application of a strong electric field to the tip and an image is produced by the projection of the ions onto a fluorescent screen. The image consists of a pattern of spots of light which correspond to individual atoms on the specimen surface. When a sudden voltage pulse is applied to the tip, atoms from the surface of the specimen itself are be ejected and travel down a drift tube where their arrival time (a measure of the mass of the atom) can be determined. This allows the atomic composition of the specimen to be determined. [CHMO]" ;
skos:prefLabel "atom probe field ion microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000206
af-p:AFP_0000206 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000945 ;
skos:altLabel "SPCM" ;
skos:definition "A type of microscopy where a laser is scanned over the surface of the specimen and the photocurrent is recorded as a function of position. [CHMO]" ;
skos:prefLabel "scanning photocurrent microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000218
af-p:AFP_0000218 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002405 ;
skos:altLabel "PSTM" ,
"photon scanning tunneling microscopy" ,
"photon-scanning tunneling microscopy" ,
"photon-scanning tunnelling microscopy" ;
skos:definition "A type of microscopy where the specimen is illuminated with a near-field of photons. An image of the surface is obtained by mechanically moving an optical fibre probe in a raster scan over the specimen, line by line, and detecting any photons which tunnel from the specimen to the probe as a function of position. A feedback loop is used to maintain a fixed relationship between the optical fibre probe and surface during scanning. [CHMO]" ;
skos:prefLabel "photon scanning tunnelling microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000221
af-p:AFP_0000221 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002032 ;
skos:altLabel "STXM" ,
"STXRM" ,
"scanning TXM" ,
"scanning transmission XM" ;
skos:definition "An imaging technique where a finely focused (20-50 nm) beam of X-rays is scanned over the surface of the specimen, and the energies and intensities of the transmitted X-rays are measured as a function of position. [CHMO]" ;
skos:prefLabel "scanning transmission X-ray microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000239
af-p:AFP_0000239 rdf:type owl:Class .
### http://purl.allotrope.org/ontologies/process#AFP_0000270
af-p:AFP_0000270 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000044 ;
skos:definition "Microscopy in which the same object (e.g., a cell) is imaged at regular time intervals over several hours. [CHMO]" ;
skos:prefLabel "time-lapse microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000272
af-p:AFP_0000272 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000468 ,
af-p:AFP_0002280 ;
skos:altLabel "RIC microscopy" ,
"RICM" ,
"reflection interference contrast (RIC) microscopy" ,
"reflection interference contrast (RIC-) microscopy" ;
skos:definition "A type of microscopy that determines the specimen's shape and distance awaynfrom a nearby, usually flat, reflective surface from the interference pattern produced by light reflecting from both the object and the surface. A microscope objective focusses a laser on the fluorescent specimen, and the same objective collects fluorescence. The interference between the fluorescence directly emitted by the specimen and the fluorescence reflected by the surface is observed by measuring the intensity of fluorescence passing through a confocal pinhole. [CHMO]" ;
skos:prefLabel "reflection interference contrast microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000295
af-p:AFP_0000295 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000945 ;
skos:altLabel "SAM" ,
"SPAM" ,
"scanning acoustic microscopy" ;
skos:definition "A type of microscopy where a probe vibrating at its resonant frequency is scanned over the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the resonant frequency (or the amplitude of vibration) of the tip as a function of position. A feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. [CHMO]" ;
skos:prefLabel "scanning probe acoustic microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000332
af-p:AFP_0000332 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001515 ,
af-p:AFP_0002311 ;
skos:altLabel "BF-STEM" ,
"bright field scanning transmission electron microscopy" ;
skos:definition "A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum. The beam of electrons passes directly through an aperture before reaching the specimen. The image results from a weakening of the direct beam by its interaction with the sample. [CHMO]" ;
skos:prefLabel "bright-field scanning transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000334
af-p:AFP_0000334 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002244 ;
skos:altLabel "negative stain EM" ,
"negative stain electron microscopy" ,
"negative-stain EM" ;
skos:definition "A type of microscopy where the specimen is stained with heavy metals salts (to improve contrast) before being bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. [CHMO]" ;
skos:prefLabel "negative-stain electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000336
af-p:AFP_0000336 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000504 ;
skos:altLabel "S-FTIR imaging" ,
"S-FTIR mapping" ,
"S-FTIR microscopy" ,
"S-FTIR microspectroscopy" ,
"SFT-IR imaging" ,
"SFT-IR microscopy" ,
"SFTIR-MSP" ,
"synchrotron FTIR microspectroscopy" ,
"synchrotron Fourier transform infra-red microscopy" ,
"synchrotron Fourier transform infra-red microspectrometry" ,
"synchrotron Fourier transform infra-red microspectroscopy" ,
"synchrotron Fourier transform infrared microscopy" ,
"synchrotron Fourier transform infrared microspectrometry" ,
"synchrotron Fourier transform infrared microspectroscopy" ,
"synchrotron-based FTIR microscopy" ,
"synchrotron-based Fourier transform infrared microscopy" ;
skos:definition "The collection of spatially resolved infrared spectra of a sample during optical microscopy. The infrared spectra are obtained by single pulse of infrared radiation, produced in a synchrotron, and are subject to a Fourier transform. [CHMO]" ;
skos:prefLabel "synchrotron Fourier transform infrared microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000339
af-p:AFP_0000339 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002343 ;
skos:altLabel "NEXAFS microscopy" ,
"near edge X-ray absorption fine structure (NEXAFS) microscopy" ,
"near-edge X-ray absorption fine structure (NEXAFS) microscopy" ;
skos:definition "An imaging technique where soft X-rays (100-1000 eV) are directed at the specimen, and the difference in the X-ray absorption coefficient measured within 40 eV of the absorption edge by different elements (mainly O and C) produces an image. [CHMO]" ;
skos:prefLabel "near-edge X-ray absorption fine structure microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000374
af-p:AFP_0000374 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000468 ;
skos:altLabel "FLSM" ,
"LSM" ,
"laser scanning fluorescence microscopy" ,
"laser scanning microscopy" ;
skos:definition "A type of microscopy where the specimen can be made to fluoresce (emit energy as visible light) by scanning a laser spot of specific wavelength over its surface. [CHMO]" ;
skos:prefLabel "fluorescence laser scanning microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000397
af-p:AFP_0000397 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002221 ;
skos:altLabel "HAADF-STEM" ,
"high angle annular dark field scanning transmission electron microscopy" ,
"high angular annular dark-field scanning transmission electron microscopy" ,
"high-angle annular dark-field scanning transmission electron microscopy" ;
skos:definition "A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum. The beam of electrons is scattered or diffracted at high angles before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. An annular aperture is used to select electrons that have passed through given symmetric zones within the objective lens of the microscope. [CHMO]" ;
skos:prefLabel "high-angular annular dark-field scanning transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000403
af-p:AFP_0000403 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000942 ;
skos:altLabel "vibrational microspectroscopy" ,
"vibrational spectroscopic imaging" ;
skos:definition "A type of chemical imaging spectroscopy where an optical microscope is used to image the sample and locate a small area for spectral analysis that probes the vibrational degrees of freedom of a molecule. [CHMO]" ;
skos:prefLabel "vibrational microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000409
af-p:AFP_0000409 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000496 ;
skos:altLabel "SEAM" ;
skos:definition "A type of microscopy where a pulsed electron beam is scanned over the surface of the specimen in order to generate elastic waves which are reflected and detected. [CHMO]" ;
skos:prefLabel "scanning electron acoustic microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000418
af-p:AFP_0000418 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000468 ;
skos:altLabel "multi-photon excitation microscopy " ,
"multi-photon fluorescence imaging" ,
"multi-photon fluorescence microscopy" ,
"multiphoton excitation microscopy " ,
"multiphoton fluorescence imaging" ,
"multiphoton fluorescence microscopy" ;
skos:definition "A type of microscopy where fluorophores in the specimen can be made to fluoresce (emit energy as visible light) by absorption of two or more photons. [CHMO]" ;
skos:prefLabel "multiphoton fluorescence microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000449
af-p:AFP_0000449 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001870 ;
skos:altLabel "DCM" ;
skos:definition "A type of microscopy where visible light coming from the specimen (which is placed approximately half a confocal parameter from the focal plane along the optical axis of the microscope) is collected and guided through a pinhole before it is detected. The pinhole allows only light from the focal point to pass to the detector, reducing background interference. [CHMO]" ;
skos:prefLabel "differential confocal microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000468
af-p:AFP_0000468 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000044 ;
skos:altLabel "FM" ,
"fluorescence imaging" ,
"fluorescence microscopic imaging" ;
skos:definition "Any type of microscopy where the specimen can be made to fluoresce (emit energy as visible light) by illuminating it with light of specific wavelengths. These specimens are called fluorophores. [CHMO]" ;
skos:prefLabel "fluorescence microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000472
af-p:AFP_0000472 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000739 ,
af-p:AFP_0001975 ;
skos:altLabel "confocal Raman microanalysis" ,
"confocal Raman microspectrometry" ,
"confocal Raman microspectroscopy" ,
"confocal micro Raman" ;
skos:definition "The collection of spatially resolved Raman spectra of a sample during optical microscopy. An aperture is used to discriminate between Raman signal coming from the laser spot and that coming from the out-of-focus region of the sample. [CHMO]" ;
skos:prefLabel "confocal Raman microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000476
af-p:AFP_0000476 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001096 ;
skos:altLabel "SNIM" ,
"s-SNOM" ,
"sSNOM" ,
"scattering SNOM" ,
"scattering near-field microscopy" ,
"scattering-type SNOM" ,
"scattering-type near-field microscopy" ,
"scattering-type near-field optical microscopy" ;
skos:definition "A type of microscopy where a probe consisting of a laser transmitted through a tapered optical fibre is positioned very close to (<10 nm from) the surface of the specimen and focused to a diffraction-limited spot size. A vibrating metallic AFM cantilever tip periodically and locally modifies the electromagnetic field distribution of the excitation laser. An image is produced by scanning the probe over the specimen and detecting the scattered light from the tip as a function of position. A force feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. [CHMO]" ;
skos:prefLabel "scattering near-field optical microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000492
af-p:AFP_0000492 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001216 ;
skos:definition "The simultaneous collection of AFM topography data and spatially-resolved infrared spectra by measuring the infrared absorption via transient deformation of the AFM cantilever induced by an infrared pulsed laser (tuned to a wavelength that corresponds to a vibrational absorbing wavelength in the specimen) as a function of AFM tip position. Mid-IR radiation, generated using a periodically poled LiNbO3 crystal emitting tuneable laser is focussed directly on the specimen surface. [CHMO]" ;
skos:prefLabel "surface atomic force infrared microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000496
af-p:AFP_0000496 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002244 ;
skos:altLabel "SEM" ,
"scanning electronic microscopy" ;
skos:definition "A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across the specimen under vacuum and the interaction of the electrons with the specimen is determined. [CHMO]" ;
skos:prefLabel "scanning electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000500
af-p:AFP_0000500 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000590 ;
skos:altLabel "PFM" ,
"piezo-force microscopy" ;
skos:definition "A type of microscopy where an electric field is applied to a sharp spike (known as a 'tip') which is mounted on the end of a cantilever. The tip scans the surface of a piezoelectric specimen and the distortion of the electric field by the specimen is measured as a function of position. A feedback loop is used to maintain a fixed relationship between the tip and surface during scanning. [CHMO]" ;
skos:prefLabel "piezoresponse force microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000504
af-p:AFP_0000504 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000782 ;
skos:altLabel "FT-IR imaging" ,
"FT-IR microscopy" ,
"FTIR imaging" ,
"FTIR microscopy" ,
"FTIR microspectroscopy" ,
"FTIR spectromicroscopy" ,
"FTIR-MSP" ,
"Fourier transform infra-red microspectrometry" ,
"Fourier transform infra-red microspectroscopy" ,
"Fourier transform infrared microspectrometry" ,
"Fourier transform infrared microspectroscopy" ,
"Fourier transform infrared spectromicroscopy" ,
"Fourier-transform infrared microscopy" ;
skos:definition "The collection of spatially resolved infrared spectra of a sample during optical microscopy. The infrared spectra are obtained by single pulse of infrared radiation, and are subject to a Fourier transform. [CHMO]" ;
skos:prefLabel "Fourier transform infrared microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000512
af-p:AFP_0000512 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000374 ;
skos:altLabel "single photon LSM" ,
"single photon laser scanning microscopy" ,
"single-photon LSM" ;
skos:definition "A type of microscopy where the specimen can be made to fluoresce (emit energy as visible light) by scanning a solid-state (Ti sapphire) laser spot of specific wavelength over its surface to produce single-photon fluorescence. [CHMO]" ;
skos:prefLabel "single-photon laser scanning microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000540
af-p:AFP_0000540 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002405 ;
skos:altLabel "SNEM" ;
skos:definition "A type of microscopy where a metal-coated AFM tip is positioned very close to the surface of the specimen (in the near-field) and an image of the surface is obtained by mechanically moving the tip in a raster scan of the specimen, line by line, and recording the change in the polarization of incident light when it is reflected from a surface as a function of position. A feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. [CHMO]" ;
skos:prefLabel "scanning near-field ellipsometric microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000590
af-p:AFP_0000590 rdf:type owl:Class .
### http://purl.allotrope.org/ontologies/process#AFP_0000594
af-p:AFP_0000594 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000782 ;
skos:altLabel "NIR chemical imaging spectrometry" ,
"NIR chemical imaging spectroscopy" ,
"NOIM" ,
"near infra red chemical imaging spectrometry" ,
"near infra red chemical imaging spectroscopy" ,
"near infra-red chemical imaging spectrometry" ,
"near infra-red chemical imaging spectroscopy" ,
"near infra-red microscopy" ,
"near infrared microscopy spectroscopy" ,
"near infrared optical microscopy" ,
"near-IR spectromicroscopy" ,
"near-infra-red microscopy" ,
"near-infrared microscopy" ,
"near-infrared spectromicroscopy" ;
skos:definition "The collection of spatially resolved near-infrared spectra (0.8-2 µm) of a sample during microscopy. [CHMO]" ;
skos:prefLabel "near-infrared microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000600
af-p:AFP_0000600 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001395 ,
af-p:AFP_0002248 ;
skos:altLabel "LT-TEM" ,
"cryo TEM" ,
"cryo-TEM" ,
"cryo-transmission electron microscopy " ,
"cryogenic TEM" ,
"low-temperature transmission electron microscopy" ;
skos:definition "A type of microscopy where an electron-transparent specimen, which is cooled in liquid ethane to 180 deg. C, is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]" ;
skos:prefLabel "cryogenic transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000631
af-p:AFP_0000631 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002244 ;
skos:altLabel "REM" ,
"reflection EM" ;
skos:definition "A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The electrons elastically scattered by the specimen are detected. [CHMO]" ;
skos:prefLabel "reflection electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000635
af-p:AFP_0000635 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000239 ;
skos:definition "A type of spectroscopy where the sample (in the form of a molecular beam) is vaporised by laser ablation before being irradiated with a single pulse of radiation in the microwave region (1-1000 mm) and the spectrum is subject to a Fourier transform. [CHMO]" ;
skos:prefLabel "laser ablation molecular beam Fourier transform microwave spectroscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000639
af-p:AFP_0000639 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002244 ;
skos:altLabel "HREM" ,
"high resolution EM" ,
"high resolution electron microscopy" ,
"high-resolution EM" ;
skos:definition "A type of microscopy where the specimen bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The specimen is tilted such that a low-order zone axis is closely parallel to the incident beam, and columns of atoms are viewed end-on by the beam. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. HREM imaging is used to explore crystal structures and imperfections on the atomic scale. [CHMO]" ;
skos:prefLabel "high-resolution electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000697
af-p:AFP_0000697 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001285 ;
skos:altLabel "aberration corrected high resolution transmission electron microscopy" ,
"aberration-corrected HRTEM" ;
skos:definition "A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the phase contrast between transmitted electron waves is used to produce an image. The beam is focused using a set of magnetic lenses which removes spherical aberration (an effect where the electron beam is deflected too strongly, resulting in a blurred image). [CHMO]" ;
skos:prefLabel "aberration-corrected high-resolution transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000739
af-p:AFP_0000739 rdf:type owl:Class .
### http://purl.allotrope.org/ontologies/process#AFP_0000745
af-p:AFP_0000745 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002280 ;
skos:altLabel "DIC" ,
"DIC microscopy" ,
"NIC" ,
"NIC microscopy" ,
"Nomarski interference contrast microscopy" ,
"Nomarski microscopy" ;
skos:definition "A type of microscopy where the specimen is illuminated with polarized visible light split into two beams, which then interfere to produce fringes whose spacing is proportional to the height of the specimen. [CHMO]" ;
skos:prefLabel "differential interference contrast microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000782
af-p:AFP_0000782 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000403 ;
skos:altLabel " infra-red chemical imaging spectroscopy" ,
"IR microscopy" ,
"IR spectromicroscopy" ,
"IR-MSP" ,
"IRI" ,
"infra-red chemical imaging spectrometry" ,
"infra-red microscopy" ,
"infrared chemical imaging spectrometry" ,
"infrared chemical imaging spectroscopy" ,
"infrared mapping" ,
"infrared microspectrophotometry" ,
"infrared microspectroscopy" ,
"infrared spectromicroscopy" ;
skos:definition "The collection of spatially resolved infrared spectra of a sample during optical microscopy. [CHMO]" ;
skos:prefLabel "infrared microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000818
af-p:AFP_0000818 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002244 ;
skos:altLabel "PEEM" ,
"PEM" ,
"photo-electron microscopy" ,
"photo-emission microscopy" ,
"photoelectron microscopy" ;
skos:definition "A type of electron microscopy where the distribution of electrons emitted by a specimen sample following excitation by UV light, synchrotron radiation or X-ray sources is used to produce an image. [CHMO]" ;
skos:prefLabel "photoemission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000819
af-p:AFP_0000819 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000468 ;
skos:altLabel "IR fluorescence microscopy" ,
"infra-red fluorescence microscopy" ;
skos:definition "A type of microscopy where the specimen can be made to fluoresce (emit energy as visible light) by illuminating it with radiation in the infra-red region (2.5-16 μm). [CHMO]" ;
skos:prefLabel "infrared fluorescence microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000850
af-p:AFP_0000850 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000044 ;
skos:altLabel "IM" ;
skos:definition "A type of microscopy where ions are used to produce an image. [CHMO]" ;
skos:prefLabel "ion microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000858
af-p:AFP_0000858 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001330 ;
skos:altLabel "DFOMS" ,
"SNOMS" ,
"dark-field single-nanoparticle optical microscopy and spectroscopy" ,
"darkfield optical microscopy and spectroscopy" ;
skos:definition "A type of spectroscopy where a dark-field optical microscope is used to image the sample and locate a small area for spectral analysis with radiation in the ultraviolet to near infrared range. [CHMO]" ;
skos:prefLabel "dark-field optical microscopy and spectroscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000860
af-p:AFP_0000860 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002244 ;
skos:altLabel "FEM" ,
"field electron microscopy" ,
"field emission electron microscopy" ,
"field emission microscopy" ,
"field-emission microscopy" ;
skos:definition "A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) electron beam produced by field emission with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. [CHMO]" ;
skos:prefLabel "field-emission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000922
af-p:AFP_0000922 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001395 ;
skos:altLabel "EF-TEM" ,
"EF/TEM" ,
"EFTEM" ,
"ESI" ,
"electron spectroscopic imaging" ,
"energy filtered TEM" ,
"energy filtered transmission electron microscopy" ,
"energy-filtered TEM" ;
skos:definition "A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of transmitted electrons of particular kinetic energies are measured. [CHMO]" ;
skos:prefLabel "energy-filtered transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000923
af-p:AFP_0000923 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001680 ;
skos:altLabel "EFM" ,
"electric force microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000924
af-p:AFP_0000924 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002244 ;
skos:altLabel "WBDF electron microscopy" ,
"weak beam dark field electron microscopy" ,
"weak-beam dark-field (WBDF) electron microscopy" ;
skos:definition "A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. A diffracted beam harmonic (a 'weak beam') is used rather than the diffracted beam itself, allowing much higher resolution to be obtained. [CHMO]" ;
skos:prefLabel "weak-beam dark-field electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000940
af-p:AFP_0000940 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001515 ,
af-p:AFP_0002439 ;
skos:altLabel "DF-STEM" ;
skos:definition "A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum. The beam of electrons is scattered or diffracted before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. [CHMO]" ;
skos:prefLabel "dark-field scanning transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000941
af-p:AFP_0000941 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000097 ;
skos:altLabel "X-ray micro-probe spectrometry" ,
"X-ray microanalysis" ,
"X-ray microprobe spectrometry" ,
"X-ray microprobe spectroscopy" ,
"XMPS" .
### http://purl.allotrope.org/ontologies/process#AFP_0000942
af-p:AFP_0000942 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002432 ;
skos:altLabel "microspectrometry" .
### http://purl.allotrope.org/ontologies/process#AFP_0000945
af-p:AFP_0000945 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000044 ;
skos:altLabel "SPM" ,
"scanning-probe microscopy" ;
skos:definition "A type of microscopy which uses a probe to scan the surface of the specimen and measure some form of interaction between surface and probe. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position. A feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. [CHMO]" ;
skos:prefLabel "scanning probe microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000954
af-p:AFP_0000954 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001412 ;
skos:altLabel "MRFM" ;
skos:definition "A type of microscopy which uses a cantilever tipped with a ferromagnetic (iron cobalt) particle to directly detect a modulated spin gradient force between sample spins and the tip to scan the surface of a magnetic specimen. As the ferromagnetic tip moves close to the sample, the nuclear spins become attracted to it and generate a small force on the cantilever. The spins are then repeatedly flipped, causing the cantilever to gently sway back and forth in a synchronous motion. That displacement is measured with an interferometer to create a series of 2D images of the sample. [CHMO]" ;
skos:prefLabel "magnetic resonance force microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000976
af-p:AFP_0000976 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000590 ;
skos:definition "A type of microscopy which uses a sharp spike (known as a 'tip') mounted on the end of a cantilever to scan the surface of the specimen. The tip oscillates, intermittently touching or tapping the surface. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the force experienced by the tip as a function of position. A feedback loop is used to maintain a fixed relationship between the tip and surface during scanning. [CHMO]" ;
skos:prefLabel "dynamic force microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0000996
af-p:AFP_0000996 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000818 ;
skos:altLabel "X-ray excited PEEM" ,
"X-ray photoelectron microscopy" ,
"XPEEM" ;
skos:definition "A type of electron microscopy where the distribution of electrons emitted by a specimen sample following excitation with an X-ray source is used to produce an image. [CHMO]" ;
skos:prefLabel "X-ray photoemission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001006
af-p:AFP_0001006 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001395 ;
skos:altLabel "Cs-corrected TEM" ,
"aberration-corrected TEM" ,
"spherical-aberration-corrected TEM" ,
"spherical-aberration-corrected transmission electron microscopy" ;
skos:definition "A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum and the intensities of the transmitted electrons are measured. The electron beam is focused using a set of magnetic lenses which removes spherical aberration (an effect where the electron beam is deflected too strongly, described by the spherical aberration coefficient 'Cs', which results in a blurred image). [CHMO]" ;
skos:prefLabel "aberration-corrected transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001014
af-p:AFP_0001014 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000496 ;
skos:altLabel "FE SEM" ,
"FE-SEM" ,
"FE/SEM" ,
"FEG-SEM" ,
"FEGSEM" ,
"FESEM" ,
"FSEM" ,
"field emission gun scanning electron microscopy" ,
"field emission scanning electron microscopy" ,
"field-emission gun scanning electron microscopy" ;
skos:definition "A type of microscopy where a finely focused (<10 nm diameter) electron beam produced by thermionic emission heating (field emission) and with an acceleration voltage 50-150 kV is scanned across the specimen under vacuum and the interaction of the electrons with the specimen is determined. [CHMO]" ;
skos:prefLabel "field-emission scanning electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001039
af-p:AFP_0001039 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001860 ;
skos:altLabel "SPNM" ,
"scanning-plasmon near-field microscopy" ;
skos:definition "A type of microscopy where a laser spot is focused on a solid sharp noble metal probe very close to (<10 nm from) the surface of the specimen. The laser spot excites plasmons at the probe-surface interface and an image is produced by scanning the probe over the specimen and detecting the electromagnetic field as a function of position. A force feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. [CHMO]" ;
skos:prefLabel "scanning plasmon near-field microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001055
af-p:AFP_0001055 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001063 ;
skos:altLabel "SPLEEM" ,
"spin polarised LEEM"@en-gb ,
"spin polarised low energy electron microscopy"@en-gb ,
"spin polarized LEEM" ,
"spin-polarised LEEM"@en-gb ,
"spin-polarised low-energy electron microscopy"@en-gb ,
"spin-polarized LEEM" ;
skos:definition "A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) low energy (1-100 eV) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. A magnet is used to align all electron spins parallel to the sample surface. [CHMO]" ;
skos:prefLabel "spin-polarised low energy electron microscopy"@en-gb ,
"spin-polarized low-energy electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001063
af-p:AFP_0001063 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002244 ;
skos:altLabel "LE EM" ,
"LEEM" ,
"low energy EM" ,
"low energy electron microscopy" ,
"low-energy EM" ;
skos:definition "A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) low energy (1-100 eV) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. [CHMO]" ;
skos:prefLabel "low-energy electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001072
af-p:AFP_0001072 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000924 ,
af-p:AFP_0001395 ;
skos:altLabel "WBDF TEM" ,
"WBDF transmission electron microscopy" ,
"weak beam dark field transmission electron microscopy" ,
"weak-beam dark-field (WBDF) transmission electron microscopy" ;
skos:definition "A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. A diffracted beam harmonic (a 'weak beam') is used rather than the diffracted beam itself, allowing much higher resolution to be obtained. [CHMO]" ;
skos:prefLabel "weak-beam dark-field transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001096
af-p:AFP_0001096 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002405 ;
skos:altLabel "NSOM" ,
"SNOM" ,
"aperture NSOM" ,
"aperture SNOM" ,
"aperture scanning near-field optical microscopy" ,
"aperture-NSOM" ,
"aperture-SNOM" ,
"near-field scanning optical microscopy" ;
skos:definition "A type of microscopy where a probe consisting of a laser transmitted through a tapered optical fibre is positioned very close to (<10 nm from) the surface of the specimen. The tip is coated with metal (to prevent light from escaping from the sides) and near-field (or evanescent field) light is emitted through a small opening or 'aperture' (50-100 nm in diameter) at the apex of the probe. An image is produced by scanning the probe over the specimen and detecting the disturbance of the near-field as a function of position. A force feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. [CHMO]" ;
skos:prefLabel "scanning near-field optical microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001097
af-p:AFP_0001097 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002198 ;
skos:altLabel "SIMS imaging" ,
"SIMS microscopy" ,
"secondary ion mass spectroscopy imaging" ;
skos:definition "The collection of spatially resolved mass spectra of a sample during microscopy where the sample is bombarded with a stream of primary mass-selected particles and the secondary ions ejected from the sample are detected. The spectra are used to visualise the spatial distribution of compounds by their molecular masses. [CHMO]" ;
skos:prefLabel "secondary ion mass spectrometry imaging" .
### http://purl.allotrope.org/ontologies/process#AFP_0001152
af-p:AFP_0001152 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001339 ;
skos:altLabel "PEMS" ,
"PESM" ,
"photoelectron micro-spectrometry" ,
"photoelectron micro-spectroscopy" ,
"photoelectron microspectrometry" ;
skos:definition "A type of spectroscopy where the sample is illuminated with a finely focused (<10 m) photon beam causing ionization and the emission of photoelectrons, the energies of which are measured. [CHMO]" ;
skos:prefLabel "photoelectron microspectroscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001158
af-p:AFP_0001158 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000500 ;
skos:altLabel "VPFM" ,
"vector PFM" ;
skos:definition "A type of microscopy where an electric field is applied to a sharp spike (known as a 'tip') which is mounted on the end of a cantilever. The tip scans the surface of a piezoelectric specimen and the distortion of the electric field by the specimen is measured as components from three directions (one vertical and two lateral). A feedback loop is used to maintain a fixed relationship between the tip and surface during scanning. [CHMO]" ;
skos:prefLabel "vector piezoresponse force microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001160
af-p:AFP_0001160 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001096 ;
skos:altLabel "IR-NSOM" ,
"IR-SNOM" ,
"SNFIM" ,
"SNIM" ,
"SNIM imaging" ,
"infra-red near-field scanning optical microscopy" ,
"infra-red scanning near-field optical microscopy" ,
"infrared near-field scanning optical microscopy" ;
skos:definition "A type of microscopy where a probe consisting of an infrared laser transmitted through a tapered optical fibre is positioned very close to (<10 nm from) the surface of the specimen. The tip is coated with metal (to prevent light from escaping from the sides) and near-field (or evanescent field) infrared radiation is emitted through a small opening or 'aperture' (50-100 nm in diameter) at the apex of the probe. An image is produced by scanning the probe over the specimen and detecting the disturbance of the infrared near-field as a function of position. A force feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. [CHMO]" ;
skos:prefLabel "infrared scanning near-field optical microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001184
af-p:AFP_0001184 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002280 ;
skos:definition "A type of microscopy where the specimen is illuminated with short-coherence length visible light split into two beams, which then interfere to produce fringes whose spacing is proportional to the height of the specimen. [CHMO]" ;
skos:prefLabel "low coherence interference microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001193
af-p:AFP_0001193 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000945 ;
skos:altLabel "SECM" ,
"scanning-electrochemical microscopy" ;
skos:definition "A type of microscopy where an electrode probe is positioned very close to the surface of the specimen (in the near-field). The surface is mechanically scanned by the electrode in a raster scan and the height required by a feedback loop in order to maintain a constant electrical conductance between the electrode and the specimen is recorded as a function of position. [CHMO]" ;
skos:prefLabel "scanning electrochemical microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001216
af-p:AFP_0001216 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000782 ;
skos:altLabel "AFMIR" ,
"atomic force microscopy infrared microscopy" ;
skos:definition "The simultaneous collection of AFM topography data and spatially-resolved IR spectra by measuring the IR absorption via transient deformation of the AFM cantilever induced by an infrared pulsed laser (tuned to a wavelength that corresponds to a vibrational absorbing wavelength in the specimen) as a function of AFM tip position. [CHMO]" ;
skos:prefLabel "atomic force infrared microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001253
af-p:AFP_0001253 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000945 ;
skos:altLabel "SCAM" ,
"scanning-capacitance microscopy" ;
skos:definition "A type of microscopy which uses a small electrode to scan the surface of the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the electrostatic capacitance of the surface as a function of position. A feedback loop is used to maintain a fixed relationship between the electrode and surface during scanning. [CHMO]" ;
skos:prefLabel "scanning capacitance microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001261
af-p:AFP_0001261 rdf:type owl:Class .
### http://purl.allotrope.org/ontologies/process#AFP_0001269
af-p:AFP_0001269 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000819 ;
skos:altLabel "NIRF microscopy" ,
"NIRFM" ,
"near infra-red fluorescence microscopy" ,
"near-infrared fluorescence microscopy" ;
skos:definition "A type of microscopy where the specimen can be made to fluoresce (emit energy as visible light) by illuminating it with radiation in the near infra-red region (0.8-2.5 μm). [CHMO]" ;
skos:prefLabel "near-infrared fluorescence microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001282
af-p:AFP_0001282 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000945 ;
skos:altLabel "SThM" ,
"scanning-thermal microscopy" ;
skos:definition "A type of microscopy where an Wollaston wire probe is scanned over the surface of the specimen and the height required by a feedback loop in order to maintain a constant temperature between the probe and the specimen is recorded as a function of position. [CHMO]" ;
skos:prefLabel "scanning thermal microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001285
af-p:AFP_0001285 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001395 ;
skos:altLabel "HR TEM" ,
"HR-TEM" ,
"HR/TEM" ,
"HRTEM" ,
"high resolution (HR) TEM" ,
"high resolution TEM" ,
"high resolution transmission electron microscopy" ,
"high-resolution TEM" ,
"phase contrast TEM" ,
"phase contrast transmission electron microscopy" ,
"phase-contrast TEM" ,
"phase-contrast transmission electron microscopy" ;
skos:definition "A type of microscopy where an electron-transparent specimen is bombarded with several finely focused (<10 nm diameter) electron beams with an acceleration voltage 50-150 kV under vacuum, and the phase contrast between the transmitted interfering electron waves is used to produce an image. [CHMO]" ;
skos:prefLabel "high-resolution transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001301
af-p:AFP_0001301 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001152 ;
skos:altLabel "EUV photoelectron micro-spectroscopy" ,
"EUV photoelectron microspectroscopy" ,
"extreme ultra-violet photoelectron microspectroscopy" ;
skos:definition "A type of spectroscopy where the sample is illuminated with a finely focused (<10 m) extreme ultraviolet (10-121 nm) photon beam causing ionization and the emission of photoelectrons, the energies of which are measured. [CHMO]" ;
skos:prefLabel "extreme ultraviolet photoelectron microspectroscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001322
af-p:AFP_0001322 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002432 ;
skos:definition "A type of chemical imaging where an optical microscope is used to image the sample and locate a small area for fluorescence spectroscopy. [CHMO]" ;
skos:prefLabel "microspectrofluorometry" .
### http://purl.allotrope.org/ontologies/process#AFP_0001330
af-p:AFP_0001330 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000942 ;
skos:altLabel "MSP" .
### http://purl.allotrope.org/ontologies/process#AFP_0001338
af-p:AFP_0001338 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001404 ;
skos:altLabel "bright field microscopy" ,
"bright-field optical microscopy" ,
"transmitted light microscopy" ,
"transmitted-light microscopy" ;
skos:definition "A type of microscopy where the specimen is illuminated with light transmitted from a source on the opposite side of the specimen from the objective. [CHMO]" ;
skos:prefLabel "bright-field microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001395
af-p:AFP_0001395 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002244 ;
skos:altLabel "TEM" ;
skos:definition "A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]" ;
skos:prefLabel "transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001398
af-p:AFP_0001398 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000945 ;
skos:altLabel "SICM" ,
"scanning-ion conductance microscopy" ;
skos:definition "A type of microscopy where a probe consisting of a glass nano- or micro- pipette filled with electrolyte is positioned very close to (in the near-field of) a specimen which is held in an oppositely charge electrolyte. An image of the surface is obtained by mechanically moving the pipette in a raster scan of the specimen, line by line, and recording the ion conductance as a function of position. A feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. [CHMO]" ;
skos:prefLabel "scanning ion conductance microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001404
af-p:AFP_0001404 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000044 ;
skos:altLabel "OM" ,
"light microscopy" ;
skos:definition "A type of microscopy where the specimen is illuminated with visible light and a system of lenses is used to produce an image. [CHMO]" ;
skos:prefLabel "optical microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001406
af-p:AFP_0001406 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001395 ;
skos:altLabel "HV TEM" ,
"HV-TEM" ,
"HV/TEM" ,
"HVTEM" ,
"high voltage TEM" ,
"high voltage transmission electron microscopy" ,
"high-voltage TEM" ;
skos:definition "A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 700-3000 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]" ;
skos:prefLabel "high-voltage transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001412
af-p:AFP_0001412 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000590 ;
skos:altLabel "MFM" ,
"magnetic-force microscopy" ;
skos:definition "A type of microscopy which uses a sharp magnetic spike (known as a 'tip') mounted on the end of a cantilever to scan the surface of a magnetic specimen. An image of the surface is obtained by mechanically moving the tip in a raster scan of the specimen, line by line, and recording the magnetic force experienced by it as a function of position. A feedback loop is used to maintain a fixed relationship between the tip and surface during scanning. [CHMO]" ;
skos:prefLabel "magnetic force microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001435
af-p:AFP_0001435 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000295 ;
skos:altLabel "NSAM" ,
"SNAM" ,
"near-field scanning acoustic microscopy" ;
skos:definition "A type of microscopy where a probe vibrating at its resonant frequency is positioned very close to the surface of the specimen (in the near-field). An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the resonant frequency (or amplitude of vibration) of the tip as a function of position. A feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. [CHMO]" ;
skos:prefLabel "scanning near-field acoustic microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001452
af-p:AFP_0001452 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002343 ;
skos:altLabel "X-ray fluorescence imaging" ,
"XFM" ,
"XRF imaging" ,
"x-ray fluorescence microprobe (XFM) analysis" ;
skos:definition "An imaging technique where a beam of X-rays is directed at the specimen and the intensities of the X-rays emitted due to core-to-core transitions (known as 'X-ray fluorescence') are detected as a function of wavelength and position. As these energies are element-specific, X-ray fluorescence microscopy can be used to determine spatially-resolved elemental composition. [CHMO]" ;
skos:prefLabel "X-ray fluorescence microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001491
af-p:AFP_0001491 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001395 ;
skos:altLabel "FF-TEM" ,
"FF/TEM" ,
"FFTEM" ,
"freeze fracture TEM" ,
"freeze fracture transmission electron microscopy" ,
"freeze-fracture TEM" ;
skos:definition "A type of microscopy where the electron-transparent specimen (normally a fresh tissue or cell suspension) is prepared by rapid freezing using liquid nitrogen, then fractured, and the cold fractured surface is coated with Pt or Au by evaporation. The specimen is then bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]" ;
skos:prefLabel "freeze-fracture transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001513
af-p:AFP_0001513 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000418 ;
skos:altLabel "two photon excitation microscopy" ,
"two photon fluorescence imaging" ,
"two-photon excitation imaging" ,
"two-photon fluorescence imaging" ,
"two-photon fluorescence microscopy" ;
skos:definition "A type of microscopy where fluorophores in the specimen can be made to fluoresce (emit energy as visible light) by the near-simultaneous absorption of two photons. [CHMO]" ;
skos:prefLabel "two photon fluorescence microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001515
af-p:AFP_0001515 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001395 ;
skos:altLabel "STEM" ,
"scanning TEM" ;
skos:definition "A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum and the intensities of the transmitted electrons are measured. [CHMO]" ;
skos:prefLabel "scanning transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001555
af-p:AFP_0001555 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001864 ;
skos:definition "A type of microscopy where atoms of He gas in the vicinty of the specimen are ionized and an image is produced by the projection of the ions onto a fluorescent screen. The image consists of a pattern of spots of light which correspond to individual atoms on the specimen surface. [CHMO]" ;
skos:prefLabel "helium-ion microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001559
af-p:AFP_0001559 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001096 ;
skos:definition "A type of microscopy where a probe consisting of a laser of a specific wavelength transmitted through a tapered optical fibre is positioned very close to (<10 nm from) the surface of the specimen. The tip is coated with metal (to prevent light from escaping from the sides) and near-field (or evanescent field) light is emitted through a small opening or 'aperture' (50-100 nm in diameter) at the apex of the probe. An image is produced by scanning the probe over the specimen and detecting the fluorescence intensity from fluorophores on the surface of the specimen as a function of position. A force feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. [CHMO]" ;
skos:prefLabel "fluorescence scanning near-field optical microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001569
af-p:AFP_0001569 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001261 ;
skos:altLabel "SSRM" ;
skos:definition "A type of microscopy which uses a sharp conductive spike (known as a 'tip') mounted on the end of a cantilever to scan the surface of the specimen. A two-dimensional map of the carrier concentration profile (resistance) of the semiconducting specimen is obtained by applying a DC bias between the probe and specimen and mechanically moving the probe in a raster scan line-by-line, and recording the current as a function of position. A feedback loop is used to maintain a fixed relationship between the tip and surface during scanning. [CHMO]" ;
skos:prefLabel "scanning spreading resistance microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001616
af-p:AFP_0001616 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001014 ;
skos:altLabel "CFE SEM" ,
"CFE-SEM" ,
"CFE/SEM" ,
"CFEG-SEM" ,
"CFEGSEM" ,
"CFSEM" ,
"cold field emission gun scanning electron microscopy" ,
"cold field emission scanning electron microscopy" ,
"cold-field-emission gun scanning electron microscopy" ,
"cold-field-emission scanning electron microscopy" ,
"cold-field-gun scanning electron microscopy" ;
skos:definition "A type of microscopy where a finely focused (<10 nm diameter) electron beam produced by applying a high voltage to a tungsten crystal (cold-field emission) and with an acceleration voltage 50-150 kV is scanned across the specimen under vacuum and the interaction of the electrons with the specimen is determined. [CHMO]" ;
skos:prefLabel "cold-field-emission scanning electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001629
af-p:AFP_0001629 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001395 ;
skos:altLabel "TEM SAD" ,
"TEM SAED" ,
"TEM-SAD" ,
"TEM-SAED" ;
skos:definition "A method for determining structure by directing a beam of high energy (10-200 keV) electrons at the sample within a transmission electron microscope and recording the resulting diffraction pattern produced by any electrons transmitted through the sample. [CHMO]" ;
skos:prefLabel "transmission electron microscopy selected area electron diffraction" .
### http://purl.allotrope.org/ontologies/process#AFP_0001676
af-p:AFP_0001676 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000468 ;
skos:altLabel "TIRF microscopy" ,
"TIRFM" ;
skos:definition "A type of microscopy where the specimen (a fluorophore) can be made to fluoresce (emit energy as visible light) by illuminating it with light of specific wavelength. The light is totally internally reflected to generate an evanescent wave at the glass microscope slide-water interface. The evanescent wave selectively illuminates and excites fluorophores in a restricted region of the specimen allowing fluorophores on the surface to be imaged (normally the fluorescence of surface fluorophores is overwhelmed by background fluorescence). [CHMO]" ;
skos:prefLabel "total internal reflection fluorescence microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001680
af-p:AFP_0001680 rdf:type owl:Class .
### http://purl.allotrope.org/ontologies/process#AFP_0001785
af-p:AFP_0001785 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001404 ;
skos:altLabel "dark-field optical microscopy" ,
"darkfield microscopy" ,
"darkfield optical microscopy" ;
skos:definition "A type of microscopy where the sample is illuminated with visible light that is not collected by the objective lens. Only the light scattered by the specimen is collected by the lens, producing an image of a light specimen on a black background. [CHMO]" ;
skos:prefLabel "dark-field microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001790
af-p:AFP_0001790 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000468 ;
skos:definition "A type of microscopy where the specimen can be made to fluoresce (emit energy as visible light) by illuminating it with radiation in the visible region (380-750 nm). [CHMO]" ;
skos:prefLabel "visible fluorescence microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001860
af-p:AFP_0001860 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002405 ;
skos:altLabel "S-NSOM" ,
"aNSOM" ,
"aSNOM" ,
"apertureless scanning near-field optical microscopy" ,
"s-SNOM" ,
"scattering type apertureless near-field scanning optical microscopy" ,
"scattering type apertureless scanning near-field optical microscopy" ,
"scattering type near-field scanning optical microscopy" ,
"scattering type scanning near-field optical microscopy" ;
skos:definition "A type of microscopy where a laser spot is focused on a solid sharp metallic probe producing a confined light field very close to (<10 nm from) the surface of the specimen. An image is produced by scanning the probe over the specimen and detecting the scattering of the incident light by the probe as a function of position. A force feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. [CHMO]" ;
skos:prefLabel "apertureless near-field scanning optical microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001864
af-p:AFP_0001864 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000850 ;
skos:altLabel "FIM" ,
"field ionisation microscopy"@en-gb ,
"field ionization microscopy" ,
"field-ion microscopy" ,
"field-ionisation microscopy"@en-gb ,
"field-ionization microscopy" ;
skos:definition "A type of microscopy where atoms of an inert gas in the vicinty of the specimen (which is in the form of a very sharp tip <10 m diameter) are ionized by the application of a strong electric field to the tip and an image is produced by the projection of the ions onto a fluorescent screen. The image consists of a pattern of spots of light which correspond to individual atoms on the specimen surface. [CHMO]" ;
skos:prefLabel "field ion microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001866
af-p:AFP_0001866 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000468 ;
skos:altLabel "FSM" ,
"fluorescent speckle microscopy" ;
skos:definition "A type of microscopy where a very low concentration of fluorescent subunits in a polymer or peptide reveals the assembly dynamics, movement and turnover of assemblies throughout the image. [CHMO]" ;
skos:prefLabel "fluorescence speckle microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001870
af-p:AFP_0001870 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001404 ;
skos:definition "A type of microscopy where visible light coming from the specimen is collected and guided through a pinhole before it is detected. The pinhole allows only light from the focal point to pass to the detector, reducing background interference. [CHMO]" ;
skos:prefLabel "confocal microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001904
af-p:AFP_0001904 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002427 ;
skos:altLabel "UV-TLM" ,
"ultra-violet thermal-lens microscopy" ,
"ultraviolet thermal lens microscopy" ,
"ultraviolet thermal-lens microscopy" ;
skos:definition "A type of microscopy where a probe laser and a pulsed ultra-violet excitation laser and are focused onto a specimen forming a refractive index distribution resulting in a concave excitation beam. The strength of this lens is proportional to the sample concentration and is detected by a change in transmittance in the probe beam. [CHMO]" ;
skos:prefLabel "ultra-violet thermal lens microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001934
af-p:AFP_0001934 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000496 ;
skos:altLabel "E-SEM" ,
"ESEM" ,
"environmental SEM" ;
skos:definition "A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across the specimen in a gaseous environment and the interaction of the electrons with the specimen is determined. [CHMO]" ;
skos:prefLabel "environmental scanning electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001961
af-p:AFP_0001961 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000496 ;
skos:altLabel "HR SEM" ,
"HR-SEM" ,
"HRSEM" ,
"high resolution SEM" ,
"high-resolution SEM" ,
"high-resolution scanning electron microscopy" ;
skos:definition "A type of microscopy where a finely focused electron beam is scanned across the specimen under vacuum and the secondary and backscattered electrons produced are detected. [CHMO]" ;
skos:prefLabel "high resolution scanning electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001963
af-p:AFP_0001963 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000590 ;
skos:altLabel "CFM" ;
skos:definition "A type of microscopy which uses a chemically functionalised sharp spike (e.g. with thiols) mounted on the end of a cantilever to scan the surface of the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the chemical interactions between the tip and surface (e.g. gold) as a function of position. A feedback loop is used to maintain a fixed relationship between the tip and surface during scanning. [CHMO]" ;
skos:prefLabel "chemical force microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0001975
af-p:AFP_0001975 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000403 ;
skos:altLabel "LRMA" ,
"MRS" ,
"RCIS" ,
"Raman chemical imaging spectrometry" ,
"Raman chemical imaging spectroscopy" ,
"Raman imaging" ,
"Raman mapping" ,
"Raman micro spectrometry" ,
"Raman micro spectroscopy" ,
"Raman microprobe spectroscopy" ,
"Raman microspectrometry" ,
"Raman microspectroscopy" ,
"Raman spectral imaging" ,
"laser Raman microanalysis" ,
"laser Raman spectroscopy" ,
"micro Raman spectrometry" ,
"micro Raman spectroscopy" ,
"micro-Raman spectrometry" ,
"micro-Raman spectroscopy" ;
skos:changeNote "2015-12-14 Add altLabel [Amgen]" ;
skos:definition "The collection of spatially resolved Raman spectra of a sample during optical microscopy. [CHMO]" ;
skos:prefLabel "Raman microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002024
af-p:AFP_0002024 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000496 ,
af-p:AFP_0002248 ;
skos:altLabel "LT-SEM" ,
"cryo SEM" ,
"cryo-SEM" ,
"cryo-scanning electron microscopy " ,
"cryogenic SEM" ,
"low-temperature scanning electron microscopy " ;
skos:definition "A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron transparent specimen under vacuum and the intensities of the transmitted electrons are measured. A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across the specimen, which is cooled in liquid ethane to 180 deg. C, under vacuum and the interaction of the electrons with the specimen is determined. [CHMO]" ;
skos:prefLabel "cryogenic scanning electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002032
af-p:AFP_0002032 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002343 ;
skos:altLabel "TXM" ,
"transmission XM" ;
skos:definition "An imaging technique where a finely focused beam of X-rays is directed at the specimen and the energies and intensities of the transmitted X-rays are measured as a function of position. [CHMO]" ;
skos:prefLabel "transmission X-ray microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002034
af-p:AFP_0002034 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000976 ;
skos:definition "A type of microscopy which uses a sharp spike (known as a 'tip') mounted on the end of a cantilever to scan the surface of the specimen. The tip oscillates parallel to the surface. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the force experienced by the tip as a function of position. A feedback loop is used to maintain a fixed relationship between the tip and surface during scanning. [CHMO]" ;
skos:prefLabel "shear force microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002053
af-p:AFP_0002053 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001404 ;
skos:altLabel "TIRM" ;
skos:definition "A type of optical microscopy which is used to monitor Brownian fluctuations in the separation between a single microscopic sphere and a flat plate in aqueous media. The sphere is levitated above the plate by colloidal forces such as double-layer or steric repulsion. Changes in elevation as small as 1 nm can be detected by measuring the light scattered by a single sphere when illuminated by an evanescent wave. [CHMO]" ;
skos:prefLabel "total internal reflection microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002069
af-p:AFP_0002069 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000496 ;
skos:altLabel "SEM EDX" ,
"SEM-EDX" ,
"SEM-EDXA" ,
"SEM/EDX" ,
"SEM/EDXA" ,
"scanning electron microscopy-energy dispersive X-ray spectroscopy" ,
"scanning electron microscopy/energy dispersive X-ray analysis" ,
"scanning electron microscopy/energy dispersive X-ray spectroscopy" ;
skos:definition "A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across the specimen under vacuum. The interaction of electrons with the specimen produces X-rays (with energies characteristic of atomic number) which are detected as a function of wavelength. [CHMO]" ;
skos:prefLabel "scanning electron microscopy energy dispersive X-ray spectroscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002074
af-p:AFP_0002074 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000476 ;
skos:altLabel "IR SNIM" ,
"IR s-SNOM" ,
"IR sSNOM" ,
"IR scattering SNOM" ,
"IR scattering near-field optical microscopy" ,
"IR scattering-type near-field optical microscopy" ,
"SNIM IR imaging" ,
"infrared s-SNOM" ,
"infrared sSNOM" ,
"infrared scattering SNOM" ,
"infrared scattering-type near-field optical microscopy" ;
skos:definition "A type of microscopy where a probe consisting of an infrared laser transmitted through a tapered optical fibre is positioned very close to (<10 nm from) the surface of the specimen and focused to a diffraction-limited spot size. A vibrating metallic AFM cantilever tip periodically and locally modifies the electromagnetic field distribution of the excitation laser. An image is produced by scanning the probe over the specimen and detecting the scattered light from the tip as a function of position. A force feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. [CHMO]" ;
skos:prefLabel "infrared scattering near-field optical microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002085
af-p:AFP_0002085 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001404 ;
skos:definition "A type of microscopy where two specimens can be compared by illuminating them with visible light using two identical sets of microscope lenses which are linked by an optical bridge. [CHMO]" ;
skos:prefLabel "comparison light microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002115
af-p:AFP_0002115 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002310 ;
skos:altLabel "two photon LSM" ,
"two photon laser scanning microscopy" ,
"two-photon LSM" ;
skos:definition "A type of microscopy where the specimen can be made to fluoresce (emit energy as visible light) by scanning a solid-state (Ti sapphire) laser spot of specific wavelength over its surface to produce multi-photon fluorescence (i.e. the fluorophore simultaneously absorbs two photons, each one half of the energy required for single-photon excitation). [CHMO]" ;
skos:prefLabel "two-photon laser scanning microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002123
af-p:AFP_0002123 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001395 ;
skos:altLabel "negative staining TEM" ,
"negative staining transmission electron microscopy" ,
"negative-staining TEM" ;
skos:definition "A type of microscopy where an electron-transparent specimen, that has been stained with heavy metals salts (e.g. uranyl acetate), is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]" ;
skos:prefLabel "negative-staining transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002131
af-p:AFP_0002131 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000850 ;
skos:altLabel "SIM" ;
skos:definition "A type of microscopy where an ion beam is scanned over the specimen surface and the secondary electrons emitted are detected. [CHMO]" ;
skos:prefLabel "scanning ion microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002150
af-p:AFP_0002150 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001184 ;
skos:altLabel "CPM" ,
"coherence-probe microscopy" ,
"phase correlation microscopy" ;
skos:definition "A type of microscopy where the surface of the specimen is illuminated with short-coherence length visible light split into two beams, which then interfere to produce fringes whose spacing is proportional to the profile of the specimen. [CHMO]" ;
skos:prefLabel "coherence probe microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002157
af-p:AFP_0002157 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001404 ;
skos:altLabel "PCM" ,
"phase-contrast microscopy" ;
skos:definition "A type of microscopy where a transparent specimen is illuminated with visible light and small phase shifts in the light passing through the specimen are used to produce an image. [CHMO]" ;
skos:prefLabel "phase contrast microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002192
af-p:AFP_0002192 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000468 ;
skos:definition "A type of microscopy where the specimen can be made to fluoresce (emit energy as visible light) by illuminating it with light of specific wavelengths. In epifluorescence microscopy light is transmitted through the objective lens onto the specimen, eliminating the need to filter out unwanted light directly from the source. [CHMO]" ;
skos:prefLabel "epifluorescence microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002198
af-p:AFP_0002198 rdf:type owl:Class .
### http://purl.allotrope.org/ontologies/process#AFP_0002210
af-p:AFP_0002210 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000590 ;
skos:altLabel "colloid force microscopy" ,
"colloidal probe AFM" .
### http://purl.allotrope.org/ontologies/process#AFP_0002215
af-p:AFP_0002215 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000374 ;
skos:altLabel "CLSM" ,
"LSCM" ,
"confocal fluorescence imaging" ,
"confocal fluorescence microscopy" ,
"confocal laser scanning fluorescence microscopy" ,
"confocal-laser scanning microscopy" ,
"fluorescence confocal microscopy" ,
"fluorescence confocal scanning laser microscopy" ,
"scanning confocal fluorescence microscopy" ;
skos:definition "A type of microscopy where the specimen can be made to fluoresce (emit energy as visible light) by scanning a gas (Ar or Kr) laser spot of specific wavelength over its surface and using a spatial pinhole to eliminate out-of-focus fluorescence. [CHMO]" ;
skos:prefLabel "confocal laser scanning microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002221
af-p:AFP_0002221 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000940 ;
skos:altLabel "ADF-STEM" ;
skos:definition "A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum. The beam of electrons is scattered or diffracted before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. An annular aperture is used to select electrons that have passed through given symmetric zones within the objective lens of the microscope. [CHMO]" ;
skos:prefLabel "annular dark-field scanning transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002244
af-p:AFP_0002244 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000044 ;
skos:altLabel "EM" ;
skos:definition "A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. [CHMO]" ;
skos:prefLabel "electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002248
af-p:AFP_0002248 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002244 ;
skos:altLabel "LT-EM" ,
"cryo EM" ,
"cryo-EM" ,
"cryo-electron microscopy " ,
"cryogenic EM" ,
"cryogenic-electron microscopy" ,
"low-temperature electron microscopy" ;
skos:definition "A type of microscopy where the specimen, which is cooled in liquid ethane to 180 deg. C, is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum and the interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. [CHMO]" ;
skos:prefLabel "cryogenic electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002250
af-p:AFP_0002250 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000945 ;
skos:altLabel "PFM" ,
"photonic-force microscopy" ;
skos:definition "A type of microscopy where optical tweezers are used to trap a small fluorescent latex bead which is then scanned across biological specimens in aqueous solution. An image of the surface is obtained by mechanically moving the bead in a raster scan of the specimen, line by line, and recording the fluorescence intensity as a function of position. A feedback loop is used to maintain a fixed relationship between the bead and surface during scanning. [CHMO]" ;
skos:prefLabel "photonic force microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002258
af-p:AFP_0002258 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000397 ,
af-p:AFP_0001006 ;
skos:altLabel "AC-HAADF-STEM" ,
"abberration corrected high angular annular dark field scanning transmission electron microscopy" ,
"abberration-corrected high-angle annular dark-field scanning transmission electron microscopy" ;
skos:definition "A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum. The beam of electrons is scattered or diffracted at high angles before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. An annular aperture is used to select electrons that have passed through given symmetric zones within the objective lens of the microscope. The electron beam is focused using a set of magnetic lenses which removes spherical aberration (an effect where the electron beam is deflected too strongly, resulting in a blurred image). [CHMO]" ;
skos:prefLabel "abberration-corrected high-angular annular dark-field scanning transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002262
af-p:AFP_0002262 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000945 ;
skos:altLabel "STM" ,
"scanning tunneling electron microscopy" ,
"scanning tunnelling electron microscopy" ,
"scanning-tunneling electron microscopy" ,
"scanning-tunnelling microscopy" ;
skos:definition "A type of microscopy which uses a sharp conducting probe (or 'tip') held very close (1 nm) to the surface of the specimen. A bias voltage is applied between the tip and specimen which causes a tunnelling current to flow. An image is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the tunnelling current as a function of position. [CHMO]" ;
skos:prefLabel "scanning tunnelling microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002280
af-p:AFP_0002280 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001404 ;
skos:altLabel "IOM" ,
"OIM" ,
"interference optical microscopy" ;
skos:definition "A type of microscopy where the specimen is illuminated with visible light split into two beams, which then interfere to produce fringes whose spacing is proportional to the height of the specimen. [CHMO]" ;
skos:prefLabel "optical interference microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002281
af-p:AFP_0002281 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000496 ;
skos:altLabel "SAM" ,
"scanning Auger electron microscopy" ;
skos:definition "A type of microscopy where a focused electron beam of small diameter is used to produce Auger electrons which are detected. [CHMO]" ;
skos:prefLabel "scanning Auger microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002310
af-p:AFP_0002310 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000374 ;
skos:altLabel "MPLSM" ,
"multi photon laser scanning microscopy" ,
"multiphoton laser scanning fluorescence microscopy " ,
"multiphoton laser scanning microscopy" ;
skos:definition "A type of microscopy where the specimen can be made to fluoresce (emit energy as visible light) by scanning a solid-state (Ti sapphire) laser spot of specific wavelength over its surface to produce multi-photon fluorescence (i.e. the fluorophore simultaneously absorbs multiple photons of typically one half to one third of the energy required for single-photon excitation). [CHMO]" ;
skos:prefLabel "multi-photon laser scanning microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002311
af-p:AFP_0002311 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001395 ;
skos:altLabel "BF-TEM" ,
"bright field TEM" ,
"bright field transmission electron microscopy" ,
"bright-field TEM" ;
skos:definition "A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV. under vacuum. The beam of electrons passes directly through an aperture before reaching the specimen. The image results from a weakening of the direct beam by its interaction with the sample. [CHMO]" ;
skos:prefLabel "bright-field transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002319
af-p:AFP_0002319 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001395 ;
skos:altLabel "TEM-EDS" ,
"TEM-EDX" ,
"TEM/EDS" ,
"TEM/EDX analysis" ;
skos:definition "A type of microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of electrons with the specimen produces X-rays (with energies characteristic of atomic number) which are detected as a function of wavelength. [CHMO]" ;
skos:prefLabel "transmission electron microscopy energy-dispersive X-ray spectroscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002343
af-p:AFP_0002343 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000044 ;
skos:altLabel "XM" ,
"XRM" ;
skos:definition "An imaging technique where soft X-rays (100-1000 eV) are directed at the specimen, and the difference in absorption of the X-rays by different elements (mainly O and C) produces an image. [CHMO]" ;
skos:prefLabel "X-ray microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002354
af-p:AFP_0002354 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000122 ;
skos:altLabel "TPLM" ,
"TPOM" ,
"transmitted optical polarising microscopy"@en-gb ,
"transmitted polarised light microscopy"@en-gb ,
"transmitted polarised optical microscopy"@en-gb ,
"transmitted polarized light microscopy" ,
"transmitted polarized light optical microscopy" ,
"transmitted polarized optical microscopy" ,
"transmitted polarized-light optical microscopy" ,
"transmitted polarizing optical microscopy" ;
skos:definition "A type of microscopy where the specimen placed between two orthogonal polarising filters and illuminated with visible light transmitted from a source on the opposite side of the specimen from the objective. [CHMO]" ;
skos:prefLabel "transmitted polarising light microscopy"@en-gb ,
"transmitted polarizing light microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002373
af-p:AFP_0002373 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001395 ;
skos:altLabel "FE TEM" ,
"FE-TEM" ,
"FE/TEM" ,
"FEG-TEM" ,
"FEGTEM" ,
"FETEM" ,
"FTEM" ,
"field emission gun transmission electron microscopy" ,
"field emission transmission electron microscopy" ,
"field-emission-gun transmission electron microscopy" ;
skos:definition "A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam produced by thermionic emission heating (field emission) and with an acceleration voltage 50-150 kV under vacuum and the intensities of the transmitted electrons are measured. [CHMO]" ;
skos:prefLabel "field-emission transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002399
af-p:AFP_0002399 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0002343 ;
skos:altLabel "SXM" ,
"SXRM" ,
"scanning XM" ,
"scanning XRM" ;
skos:definition "An imaging technique where soft X-rays (100-1000 eV) are scanned across a specimen, and the difference in absorption of the X-rays by different elements (mainly O and C) produces an image. [CHMO]" ;
skos:prefLabel "scanning X-ray microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002405
af-p:AFP_0002405 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000945 ;
skos:altLabel "near-field scanning microscopy" ;
skos:definition "Any type of microscopy where a probe is positioned very close to the surface of the specimen (in the near-field). An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position. A feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. [CHMO]" ;
skos:prefLabel "scanning near-field microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002414
af-p:AFP_0002414 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001096 ;
skos:altLabel "NSMM" ,
"SNMM" ,
"microwave near-field scanning microscopy" ,
"near-field scanning microwave microscopy" ;
skos:definition "A type of microscopy where a probe consisting of a microwave radiation source transmitted through a tapered optical fibre is positioned very close to (<10 nm from) the surface of the specimen. The tip is coated with metal (to prevent light from escaping from the sides) and near-field (or evanescent field) microwave radiation is emitted through a small opening or 'aperture' (50-100 nm in diameter) at the apex of the probe. An image is produced by scanning the probe over the specimen and detecting the disturbance of the microwave near-field as a function of position. A force feedback loop is used to maintain a fixed relationship between the probe and surface during scanning. [CHMO]" ;
skos:prefLabel "microwave scanning near-field microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002427
af-p:AFP_0002427 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000044 ;
skos:altLabel "TLM" ,
"thermal-lens microscopy" ;
skos:definition "A type of microscopy where and excitation laser and probe a laser are focused onto a specimen forming a refractive index distribution which results in a concave excitation beam. The strength of this lens is proportional to the sample concentration and is detected by a change in transmittance in the probe beam. [CHMO]" ;
skos:prefLabel "thermal lens microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002430
af-p:AFP_0002430 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000270 ,
af-p:AFP_0000468 ;
skos:altLabel "time-lapse fluorescence imaging" ;
skos:definition "A type of microscopy where the specimen can be made to fluoresce (emit energy as visible light) and the specimen is imaged at regular time intervals over several hours. [CHMO]" ;
skos:prefLabel "time-lapse fluorescence microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002433
af-p:AFP_0002433 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000782 ;
skos:altLabel "mid infra red chemical imaging spectrometry" ,
"mid infra red chemical imaging spectroscopy" ,
"mid infra-red chemical imaging spectrometry" ,
"mid infra-red chemical imaging spectroscopy" ,
"mid infra-red microscopy" ,
"mid infrared microscopy spectroscopy" ,
"mid infrared optical microscopy" ,
"mid-IR microscopy" ,
"mid-IR spectromicroscopy" ,
"mid-infra-red microscopy" ,
"mid-infrared spectromicroscopy" ;
skos:definition "The collection of spatially resolved mid-infrared spectra (3-8 µm) of a sample during microscopy. [CHMO]" ;
skos:prefLabel "mid-infrared microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002439
af-p:AFP_0002439 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0001395 ;
skos:altLabel "DF-TEM" ;
skos:definition "A type of microscopy where an electron-transparent specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV. under vacuum. The beam of electrons is scattered or diffracted before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. [CHMO]" ;
skos:prefLabel "dark-field transmission electron microscopy" .
### http://purl.allotrope.org/ontologies/process#AFP_0002441
af-p:AFP_0002441 rdf:type owl:Class ;
rdfs:subClassOf af-p:AFP_0000782 ;
skos:altLabel "S-IR imaging" ,
"S-IR microscopy" ,
"S-IR spectromicroscopy" ,
"SIR imaging" ,
"SIR microscopy" ,
"SIR microspectroscopy" ,
"SIR-MSP" ,
"SIRM" ,
"synchrotron infra-red microspectrometry" ,
"synchrotron infra-red microspectroscopy" ,
"synchrotron infrared microspectrometry" ,
"synchrotron infrared microspectroscopy" ,
"synchrotron infrared spectromicroscopy" ;
skos:definition "The collection of spatially resolved infrared spectra of a sample during optical microscopy. The infrared spectra are obtained by single pulse of infrared radiation, produced in a synchrotron, and are subject to a Fourier transform. [CHMO]" ;
skos:prefLabel "synchrotron infrared microscopy" .
### http://purl.allotrope.org/ontologies/result#AFR_0000082
af-r:AFR_0000082 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000381 ;
skos:altLabel "HREM image" ,
"HREM images" ,
"HREM micrograph" ,
"high resolution electron micrograph" ;
skos:definition "An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam with an acceleration voltage under vacuum, and detecting the transmitted, secondary, backscattered and diffracted electrons, and characteristic X-rays emitted. The specimen is tilted such that a low-order zone axis is closely parallel to the incident beam, and columns of atoms are viewed end-on by the beam. [CHMO]" ;
skos:prefLabel "high-resolution electron micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000086
af-r:AFR_0000086 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000332 ;
skos:altLabel "STEM image" ,
"STEM images" ,
"scanning transmission electron micrographs" ,
"scanning transmission electron microscopy image" ,
"scanning transmission electron microscopy images" ;
skos:definition "An image obtained by scanning the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. [CHMO]" ;
skos:prefLabel "scanning transmission electron micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000089
af-r:AFR_0000089 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000329 ,
af-r:AFR_0000350 ;
skos:altLabel "fluorescence microphotograph" ,
"fluorescence microscope image" ,
"fluorescence microscopy image" ;
skos:definition "An image obtained by illuminating the specimen with (usually) ultraviolet light, and collecting the light emitted by chromophores in the specimen (fluorescence) using a system of magnifying lenses. [CHMO]" ;
skos:prefLabel "fluorescence micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000107
af-r:AFR_0000107 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000381 ;
skos:altLabel "SEM image" ,
"SEM images" ,
"SEM micrograph" ,
"SEM micrographs" ,
"scanning electron micrograph" ,
"scanning electron microphotograph" ,
"scanning electron microscope (SEM) image" ,
"scanning electron microscope (SEM) images" ,
"scanning electron microscope (SEM) micrograph" ,
"scanning electron microscope (SEM) micrographs" ,
"scanning electron microscopy (SEM) image" ;
skos:definition "An image obtained by scanning a finely focused (<10 nm diameter) electron beam across the specimen under vacuum. [CHMO]" ;
skos:prefLabel "scanning electron micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000111
af-r:AFR_0000111 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000332 ;
skos:altLabel "Cs-corrected TEM image" ,
"Cs-corrected TEM images" ,
"aberration-corrected STEM image" ,
"aberration-corrected STEM images" ,
"spherical-aberration-corrected STEM image" ,
"spherical-aberration-corrected STEM images" ,
"spherical-aberration-corrected transmission electron micrograph" ;
skos:definition "An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. The electron beam is focused using a set of magnetic lenses which removes spherical aberration (an effect where the electron beam is deflected too strongly, described by the spherical aberration coefficient 'Cs', which results in a blurred image). [CHMO]" ;
skos:prefLabel "aberration-corrected transmission electron micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000154
af-r:AFR_0000154 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000332 ;
skos:altLabel "WBDF TEM image" ,
"WBDF TEM images" ,
"WBDF transmission electron micrograph" ,
"weak beam dark field electron micrograph" ,
"weak-beam dark-field (WBDF) transmission electron micrograph" ;
skos:definition "An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. A diffracted beam harmonic (a 'weak beam') is used rather than the diffracted beam itself, allowing much higher resolution to be obtained. [CHMO]" ;
skos:prefLabel "weak-beam dark-field transmission electron micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000159
af-r:AFR_0000159 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000089 ,
af-r:AFR_0000425 ;
skos:altLabel "CLSM image" ,
"CLSM images" ,
"LSCM image" ,
"LSCM images" ,
"confocal fluorescence image" ,
"confocal fluorescence micrograph" ,
"confocal fluorescence micrographs" ,
"confocal laser scanning fluorescence micrograph" ,
"confocal laser scanning fluorescence micrographs" ,
"confocal-laser scanning micrograph" ,
"confocal-laser scanning micrographs" ,
"fluorescence confocal micrograph" ,
"fluorescence confocal micrographs" ,
"fluorescence confocal scanning laser micrograph" ,
"scanning confocal fluorescence micrograph" ,
"scanning confocal fluorescence micrographs" ,
"scanning confocal fluorescence microscopy image" ,
"scanning confocal fluorescence microscopy images" ;
skos:definition "An image obtained by scanning a gas (Ar or Kr) laser spot of specific wavelength over the specimen and collecting the light emitted by chromophores in the specimen (fluorescence) using a system of magnifying lenses. The fluorescence passes through a pinhole before it reaches the lenses, allowing only light from the focal point to pass to the detector, reducing background interference. [CHMO]" ;
skos:prefLabel "confocal laser scanning micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000167
af-r:AFR_0000167 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000332 ;
skos:altLabel "dark field transmission electron micrograph" ,
"dark-field TEM image" ,
"dark-field TEM images" ;
skos:definition "An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the scattered transmitted electrons. [CHMO]" ;
skos:prefLabel "dark-field transmission electron micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000194
af-r:AFR_0000194 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000332 ;
skos:altLabel "bright field transmission electron micrograph" ,
"bright-field TEM image" ,
"bright-field TEM images" ;
skos:definition "An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the directly transmitted electrons. [CHMO]" ;
skos:prefLabel "bright-field transmission electron micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000205
af-r:AFR_0000205 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000332 ;
skos:altLabel "negative stained transmission electron micrograph" ,
"negative-stain TEM image" ,
"negative-stain TEM images" ,
"negative-stain TEM micrograph" ,
"negative-stain TEM micrographs" ,
"negative-stained TEM image" ,
"negatively stained TEM image" ,
"negatively stained transmission electron micrograph" ,
"negatively-stained TEM micrograph" ,
"negatively-stained TEM micrographs" ;
skos:definition "An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. The specimen is stained with heavy metals salts (e.g. uranyl acetate) to improve contrast. [CHMO]" ;
skos:prefLabel "negative-stained transmission electron micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000291
af-r:AFR_0000291 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000350 ;
skos:altLabel "polarising light micrograph" ,
"polarising light micrographs" ,
"polarising microscope image" ,
"polarising microscope images" ,
"polarizing light micrographs" ,
"polarizing microscope image" ,
"polarizing microscope images" ;
skos:changeNote "2016-02-03 Switched label [OSTHUS]" ;
skos:definition "An image obtained by placing the specimen between two orthogonal polarising filters, illuminating it with visible light, and using a system of magnifying lenses. [CHMO]" ;
skos:prefLabel "polarizing light micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000329
af-r:AFR_0000329 rdf:type owl:Class ;
rdfs:subClassOf ;
skos:definition "A 2D image obtained by measuring fluorescence. [CHMO]" ;
skos:prefLabel "fluorescence image" .
### http://purl.allotrope.org/ontologies/result#AFR_0000331
af-r:AFR_0000331 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000350 ;
skos:altLabel "dark-field microscope image" ,
"dark-field optical image" ;
skos:definition "An image obtained by illuminating the specimen with visible light that is not collected by the objective lens. Only the light scattered by the specimen is collected by the lens, producing an image of a light specimen on a black background. [CHMO]" ;
skos:prefLabel "dark-field optical micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000332
af-r:AFR_0000332 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000381 ;
skos:altLabel "TEM image" ,
"TEM images" ,
"TEM micrograph" ,
"transmission electron micrograph" ,
"transmission electron microphotograph" ,
"transmission electron microscope (TEM) image" ,
"transmission electron microscope image" ,
"transmission electron microscope images" ,
"transmission electron microscopic (TEM) images" ,
"transmission electron microscopic (TEM) imagess" ,
"transmission electron microscopy (TEM) image" ;
skos:definition "An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. [CHMO]" ;
skos:prefLabel "transmission electron micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000350
af-r:AFR_0000350 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000038 ;
skos:altLabel "light microscope image" ,
"light microscopy image" ,
"optical microphotograph" ,
"optical microscope image" ,
"optical microscopy image" ,
"photomicrograph" ;
skos:definition "An image obtained by illuminating the specimen with visible light, and using a system of magnifying lenses. [CHMO]" ;
skos:prefLabel "optical micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000381
af-r:AFR_0000381 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000038 ;
skos:altLabel "EM image" ,
"EM micrograph" ,
"electron microphotograph" ,
"electron microscopy image" ;
skos:definition "An image obtained by bombarding the specimen with a finely focused (<10 nm diameter) electron beam with an acceleration voltage under vacuum, and detecting the transmitted, secondary, backscattered and diffracted electrons, and characteristic X-rays emitted. [CHMO]" ;
skos:prefLabel "electron micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000388
af-r:AFR_0000388 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000381 ;
skos:altLabel "FE-SEM image" ,
"FE-SEM images" ,
"FE-SEM micrograph" ,
"FESEM image" ,
"FESEM images" ,
"FESEM micrographs" ,
"field emission scanning electron micrograph" ,
"field-emission scanning electron microphotograph" ,
"field-emission scanning electron microscopy (FE-SEM) image" ,
"field-emission scanning electron microscopy (SEM) image" ;
skos:definition "An image obtained by scanning a finely focused (<10 nm diameter) electron beam, produced by thermionic emission heating (field emission), across the specimen under vacuum. [CHMO]" ;
skos:prefLabel "field-emission scanning electron micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000399
af-r:AFR_0000399 rdf:type owl:Class ;
rdfs:subClassOf ;
skos:altLabel "EFM image" ,
"EFM images" ,
"EFM phase image" ,
"EFM phase images" ;
skos:definition "An image obtained by using a conducting sharp spike (known as a 'tip') mounted on the end of a cantilever to scan the surface of the specimen, line by line, and recording the drop in amplitude of the oscillating cantilever caused by the electrostatic force it experiences while the tip is biased with a voltage of a few volts, as a function of position. [CHMO]" ;
skos:prefLabel "electrostatic force microscopy image" .
### http://purl.allotrope.org/ontologies/result#AFR_0000401
af-r:AFR_0000401 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000086 ;
skos:altLabel "HAADF-STEM image" ,
"HAADF-STEM images" ,
"high angle annular dark field scanning transmission electron micrograph" ,
"high angular annular dark-field scanning transmission electron micrograph" ,
"high-angle annular dark-field scanning transmission electron micrograph" ;
skos:definition "An image obtained by scanning the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. The beam of electrons is scattered or diffracted at high angles before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. An annular aperture is used to select electrons that have passed through given symmetric zones within the objective lens of the microscope. [CHMO]" ;
skos:prefLabel "high-angular annular dark-field scanning transmission electron micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000419
af-r:AFR_0000419 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000068 ;
skos:altLabel "microspectra" ;
skos:definition "A spectrum obtained from a very small portion of a sample, for example by means of a microscope. [CHMO]" ;
skos:prefLabel "microspectrum" .
### http://purl.allotrope.org/ontologies/result#AFR_0000420
af-r:AFR_0000420 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000107 ;
skos:altLabel "high resolution scanning electron micrograph" ,
"high-resolution SEM image" ,
"high-resolution SEM images" ,
"high-resolution SEM micrograph" ,
"high-resolution SEM micrographs" ;
skos:definition "An image obtained by scanning a finely focused (<10 nm diameter) electron beam across the specimen under vacuum. The specimen is tilted such that a low-order zone axis is closely parallel to the incident beam, and columns of atoms are viewed end-on by the beam. [CHMO]" ;
skos:prefLabel "high-resolution scanning electron micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000425
af-r:AFR_0000425 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000350 ;
skos:altLabel "confocal microscopy image" ;
skos:definition "An image obtained by illuminating the specimen with visible light, and passing the light through pinhole before it reaches a system of magnifying lenses. The pinhole allows only light from the focal point to pass to the detector, reducing background interference. [CHMO]" ;
skos:prefLabel "confocal micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000449
af-r:AFR_0000449 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000090 ;
skos:altLabel "IR chemical map" ,
"IR map" ,
"IR microspectroscopic image" ,
"IR spectral map" ,
"infrared chemical map" ,
"infrared map" ,
"infrared microspectroscopic image" ,
"infrared spectral map" ;
skos:definition "A data set derived from infrared microscopy consisting of a three-dimensional image where two axes describe the x and y spatial dimensions and the third dimension represents the infrared wavelength. The image is obtained by stacking one image per infrared wavelength sequentially." ;
skos:prefLabel "infrared map" .
### http://purl.allotrope.org/ontologies/result#AFR_0000458
af-r:AFR_0000458 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000332 ;
skos:altLabel "HRTEM image" ,
"high resolution (HR) TEM images" ,
"high-resolution TEM image" ,
"high-resolution TEM images" ,
"high-resolution transmission electron image" ,
"high-resolution transmission electron microscopy (HRTEM) image" ,
"phase contrast TEM image" ,
"phase-contrast TEM image" ,
"phase-contrast TEM images" ,
"phase-contrast TEM micrograph" ,
"phase-contrast transmission electron micrograph" ,
"phase-contrast transmission electron microphotograph" ,
"phase-contrast transmission electron microscopy (TEM) image" ;
skos:definition "An image obtained by bombarding the specimen with several finely focused (<10 nm diameter) electron beams under vacuum and using the phase contrast between transmitted interfering electron waves. [CHMO]" ;
skos:prefLabel "high-resolution transmission electron micrograph" .
### http://purl.allotrope.org/ontologies/result#AFR_0000498
af-r:AFR_0000498 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000449 ;
skos:altLabel "FT-IR map" ,
"FT-IR microspectroscopic image" ,
"FT-IR spectral map" ,
"FTIR map" ,
"FTIR microspectroscopic image" ,
"FTIR spectral map" ;
skos:definition "A data set derived from FTIR microscopy consisting of a three-dimensional image where two axes describe the x and y spatial dimensions and the third dimension represents the infrared wavelength. The image is obtained by stacking one image per infrared wavelength sequentially. [CHMO]" ;
skos:prefLabel "Fourier transform infrared map" .
### http://purl.allotrope.org/ontologies/result#AFR_0000515
af-r:AFR_0000515 rdf:type owl:Class ;
rdfs:subClassOf af-r:AFR_0000519 ;
skos:altLabel "micro Raman spectra" ,
"micro Raman spectrum" ,
"micro-Raman spectra" ;
skos:definition "A plot of intensity vs. Raman shift (cm-1) obtained by measuring the Raman scattering of monochromatic light from a micrometre-sized area of a sample, located using an optical microscope. [CHMO]" ;
skos:prefLabel "micro-Raman spectrum" .
#################################################################
#
# Individuals
#
#################################################################
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rdf:type owl:NamedIndividual ,
dct:RightsStatement ;
dct:description """
These taxonomies contain material or may constitute derivative works of material which may be subject to copyright by one of the following organizations. By using these taxonomies, you agree to the following terms and conditions applicable to its contents:
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Copyright Notice and Terms for IUPAC Gold Book
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Redistribution and use in source and binary forms, with or without modification, are permitted provided that the following conditions are met:
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Copyright Notice and Terms for PSI-MS (Proteomics Standards Initiative - Mass Spectrometry) Mass spectrometer output files and spectra interpretation
_____________________________________________________________________________
Created by Matt Chambers, Andreas Bertsch, Marius Kallhardt, Eric Deutsch Fredrik Levander, Pierre-Alain Binz, and Gerhard Mayer. Publisher: HUPO Proteomics Standards Initiative Mass Spectrometry Standards Working Group and HUPO Proteomics Standards Initiative Proteomics Informatics Working Group. This work is used pursuant to a Creative Commons license available here: http://creativecommons.org/licenses/by/3.0/legalcode
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This work contains material from the Cell Ontology and Clinical Measurement Ontology, available here: http://bioportal.bioontology.org/.
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This work contains material from the European Bioinformatics Institute’s ChEBI database.
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Attribution Notice for Quantities Units Dimensions Data Types (http://www.qudt.org/)
This work contains content from www.qudt.org and is used pursuant to a Creative Commons License available here: http://creativecommons.org/licenses/by-sa/3.0/us/legalcode. The original work may have been modified.
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Copyright and Attribution Notice for Dublin Core Metadata Initiative Document
This work contains material from the following DCMI document used pursuant to a creative commons license available here: https://creativecommons.org/licenses/by/4.0/legalcode. This material may have been modified or changed.
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""" ;
dct:title "Derivative works attribution" .
### http://purl.allotrope.org/voc/copyright
rdf:type owl:NamedIndividual ,
dct:RightsStatement ;
dct:description "Copyright © 2019 Allotrope Foundation" ;
dct:rightsHolder ;
dct:title "Copyright © 2019 Allotrope Foundation" .
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rdf:type owl:NamedIndividual ,
dct:LicenseDocument ;
dct:description """This work is licensed under a Creative Commons Attribution 4.0 International License http://creativecommons.org/licenses/by/4.0/.
THESE MATERIALS ARE PROVIDED \"AS IS\" AND ALLOTROPE EXPRESSLY DISCLAIMS ALL WARRANTIES, EXPRESS, IMPLIED OR STATUTORY, INCLUDING, WITHOUT LIMITATION, THE WARRANTIES OF NON-INFRINGEMENT, TITLE, MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE.
Copyright © 2015-2020 Allotrope Foundation
""" ;
dct:title "Creative Commons Attribution 4.0 International Public License" .
### Generated by the OWL API (version 4.1.3) https://github.com/owlcs/owlapi